CAJ | 학술논문

正电子湮没技术（PA T ）是一种无损的材料探测技术，它可以反映正电子所在处电子密度信息，而电子密度信息能反映材料内部微尺寸变化，正电子对于纳米尺寸缺陷的变化非常敏感。本文用正电子湮没技术中的正电子湮没寿命谱分析技术（PLAS），对W-K混合粉体在不同温度和压强条件下烧结后的微尺寸缺陷变化进行了分析，表明压强对于W-K合金的缺陷变化没有明显的影响，而W-K合金的微尺寸缺陷随温度有明显变化。
정전자인몰기술（PA T ）시일충무손적재료탐측기술，타가이반영정전자소재처전자밀도신식，이전자밀도신식능반영재료내부미척촌변화，정전자대우납미척촌결함적변화비상민감。본문용정전자인몰기술중적정전자인몰수명보분석기술（PLAS），대W-K혼합분체재불동온도화압강조건하소결후적미척촌결함변화진행료분석，표명압강대우W-K합금적결함변화몰유명현적영향，이W-K합금적미척촌결함수온도유명현변화。
Positron annihilation technology (PA T ) is a non-destructive testing technology that can reflect the electron density in materials ,therefore this technique can reflect the vacancy information in metals . Positron is very sensitive to the changes of nano-sized defects in materials .T he changes in micro size of defects in W-K alloy which was sintered under different conditions of temperature and pressure were studied based on the positron annihilation life spectroscopy (PLAS) .The results showed that the pres-sure barely affects ,but the temperature obviously affects the defects in W-K alloy .