CAJ | 학술논문

为了实现同时探测辐射的分布和照射量率，提出了一种利用CMOS成像测量低能γ射线和X射线的方法。测试系统利用CMOS图像传感器实现辐射成像并根据灰度值计算辐射的照射量率。实验证实，在低剂量、短时间的探测中，辐射对器件的损伤可以忽略。实验结果表明，用CMOS成像可实现辐射的二维分布和照射量率的同时测量。
위료실현동시탐측복사적분포화조사량솔，제출료일충이용CMOS성상측량저능γ사선화X사선적방법。측시계통이용CMOS도상전감기실현복사성상병근거회도치계산복사적조사량솔。실험증실，재저제량、단시간적탐측중，복사대기건적손상가이홀략。실험결과표명，용CMOS성상가실현복사적이유분포화조사량솔적동시측량。
In order to realize radiation distribution and exposure rate detection simultaneously , the paper puts forward a new design method for low energy γray and X ray detection which uses CMOS imaging directly .In the detection system , CMOS is used to image and the exposure rate is acquired according to images ’ gray val-ue.Experiments confirmed that the radiation damage on the device can be ignored when radiation dose is low and detection time is short .The experimental results show that CMOS imaging can be used to detect two -di-mensional (2D) distribution and exposure rate simultaneously .