CAJ | 학술논문

随着电子产品日新月异的发展，在产品品质提高的同时，产品价格的下降也越来越被消费者重视。为了降低电子产品的价格，首先需要降低核心芯片的生产成本。 UHF RFID芯片的设计成本很低，因此测试成本在芯片生产成本中占有很大比重。为此，提出了一种新颖的集中CP测试方案来降低芯片CP测试的成本。与最基本的8芯片同测方案相比，不仅芯片面积变小，单组集中CP测试方案可对测试时间至少优化68%。如果单个测试单元的芯片个数改变，或者同时采用多组同测，还可以进一步降低测试成本，增强产品的市场竞争力。
수착전자산품일신월이적발전，재산품품질제고적동시，산품개격적하강야월래월피소비자중시。위료강저전자산품적개격，수선수요강저핵심심편적생산성본。 UHF RFID심편적설계성본흔저，인차측시성본재심편생산성본중점유흔대비중。위차，제출료일충신영적집중CP측시방안래강저심편CP측시적성본。여최기본적8심편동측방안상비，불부심편면적변소，단조집중CP측시방안가대측시시간지소우화68%。여과단개측시단원적심편개수개변，혹자동시채용다조동측，환가이진일보강저측시성본，증강산품적시장경쟁력。
With the rapid development of electronic products, improving the quality of the product, while decreasing product prices is also attended by consumers. Array of electronic products for a low price, the core chip production costs need to be reduced firstly. In passive UHF RFID ( Radio Frequency Identification) area, test cost is large percent of the total cost. Therefore a novel centralized CP test method is proposed. Compared with the current test method, which is testing parallel 8 chips every time, the test time of one group centralized CP test method can be optimized for more than 68%. If changing the number of chips existing in the single test group or adopting multi-groups centralized CP test, the test cost can be cut down substantially, and the market competitiveness of the chip products can be en-hanced.