CAJ | 학술논문

为研究三种不同触头材料（真空熔渗CuCr50、真空熔铸CuCr40Te0.005、电弧熔炼CuCr50）对真空灭弧室投切背靠背电容器组性能的影响，将采用三种不同材料制备的触头各装配在三只相同的12 kV等级真空灭弧室中，每只真空灭弧室经过80次背靠背电容器组合分操作，高频涌流设定为幅值8 kA、频率3.8 kHz。结果表明：真空熔渗CuCr50、真空熔铸CuCr40Te0.005以及电弧熔炼CuCr50的平均重击穿概率分别为6.7%、5.8%、8.3%，重击穿现象主要发生于恢复电压持续时间的1/4T与10T之间（T表示恢复电压周期20 ms）；复燃现象多次出现，真空熔铸CuCr40Te0.005（1次）<电弧熔炼CuCr50（9次）<真空熔渗CuCr50（10次）。
위연구삼충불동촉두재료（진공용삼CuCr50、진공용주CuCr40Te0.005、전호용련CuCr50）대진공멸호실투절배고배전용기조성능적영향，장채용삼충불동재료제비적촉두각장배재삼지상동적12 kV등급진공멸호실중，매지진공멸호실경과80차배고배전용기조합분조작，고빈용류설정위폭치8 kA、빈솔3.8 kHz。결과표명：진공용삼CuCr50、진공용주CuCr40Te0.005이급전호용련CuCr50적평균중격천개솔분별위6.7%、5.8%、8.3%，중격천현상주요발생우회복전압지속시간적1/4T여10T지간（T표시회복전압주기20 ms）；복연현상다차출현，진공용주CuCr40Te0.005（1차）<전호용련CuCr50（9차）<진공용삼CuCr50（10차）。
This paper investigates the performance of back-to-back capacitor bank switching in vacuum interrupters(VIs) with contacts prepared by three different technologies, including infiltration CuCr50, vacuum induction melting CuCr40Te0.005, and vacuum arc melting CuCr50. Each kind of contacts is installed in three 12 kV VIs and the VIs undergo 80 closing/opening operations of back-to-back capacitor bank switching tests at an inrush current of 8 kA (peak value, frequency 3.8 kHz). Results show that the average values of the restrike probability of the VIs for each contact material are as following: the vacuum induction melting CuCr40Te0.005 is 5.8%; the infiltration CuCr50 is 6.7%; and the vacuum arc melting CuCr50 is 8.3%. For all VIs, the restrikes mainly occur between 1/4T and 10T of the recovery voltage(T, the cycle of the recovery voltage, is 20 ms). Reignition also occurs before 1/4T, and the occurrence number as follows:vacuum induction melting CuCr40Te0.005(1 time)<vacuum arc melting CuCr50(9 times)<infiltration CuCr50(10 times).