真空
真空
진공
VACUUM
2014年
1期
48-52
,共5页
李强%康振锋%刘文德%郑平平%肖玲玲%范悦%薄青瑞%齐彬彬%丁铁柱
李彊%康振鋒%劉文德%鄭平平%肖玲玲%範悅%薄青瑞%齊彬彬%丁鐵柱
리강%강진봉%류문덕%정평평%초령령%범열%박청서%제빈빈%정철주
脉冲激光沉积%CuIn(1-x)GaxSe2%XPS逐层刻蚀%双梯度带隙
脈遲激光沉積%CuIn(1-x)GaxSe2%XPS逐層刻蝕%雙梯度帶隙
맥충격광침적%CuIn(1-x)GaxSe2%XPS축층각식%쌍제도대극
pulsed laser deposition%CuIn(1-x)GaxSe2%XPS etching layer-by-layer%double-graded band gap
采用脉冲激光沉积(PLD)方法,在钠钙玻璃上沉积不同 Ga 含量的CuIn (1-x)GaxSe2薄膜,研究不同Ga含量对CIGS薄膜结构及光学特性的影响。研究表明:随着 Ga含量增加, CIGS薄膜的光学带隙增大。优选特性较好的CIGS沉积在同一个钠钙玻璃衬底上,使 Ga/( In+Ga )比在薄膜内纵深方向呈先减小后增加的变化。采用 XPS逐层刻蚀分析薄膜的元素组成,利用带隙近似公式得到能带随深度变化情况,最终得到结构、光学特性和电学特性较好的双梯度带隙结构薄膜。
採用脈遲激光沉積(PLD)方法,在鈉鈣玻璃上沉積不同 Ga 含量的CuIn (1-x)GaxSe2薄膜,研究不同Ga含量對CIGS薄膜結構及光學特性的影響。研究錶明:隨著 Ga含量增加, CIGS薄膜的光學帶隙增大。優選特性較好的CIGS沉積在同一箇鈉鈣玻璃襯底上,使 Ga/( In+Ga )比在薄膜內縱深方嚮呈先減小後增加的變化。採用 XPS逐層刻蝕分析薄膜的元素組成,利用帶隙近似公式得到能帶隨深度變化情況,最終得到結構、光學特性和電學特性較好的雙梯度帶隙結構薄膜。
채용맥충격광침적(PLD)방법,재납개파리상침적불동 Ga 함량적CuIn (1-x)GaxSe2박막,연구불동Ga함량대CIGS박막결구급광학특성적영향。연구표명:수착 Ga함량증가, CIGS박막적광학대극증대。우선특성교호적CIGS침적재동일개납개파리츤저상,사 Ga/( In+Ga )비재박막내종심방향정선감소후증가적변화。채용 XPS축층각식분석박막적원소조성,이용대극근사공식득도능대수심도변화정황,최종득도결구、광학특성화전학특성교호적쌍제도대극결구박막。
The CuIn (1-x)GaxSe2 thin films with different Ga contents were deposited on the soda lime glass by pulsed laser deposition method . The influence of different Ga contents on the films structure and optical properties were studied . The results show that: the optical band gap of the CIGS thin films increase with increasing the Ga contents . Then the CIGS films with good characteristics were sequentially deposited on the same soda lime glass . The elements of thin film were studied with XPS etching layer-by-layer , and the variation of band gap in the depth direction was calculated by the band gap approximate formula . Finally , double-graded band gap thin films with good structure , optical and electrical characteristics were obtained .