CAJ | 학술논문

　　针对Nand Flash存储器存在坏块的问题，提出一种基于STM32的Flash存储器坏块自动检测方法，通过STM32内部可变静态存储控制器，发出相应的数据、地址、控制信号，在不增加外部器件的情况下，快速访问Flash存储器，并给出了部分硬件电路和C语言编写的程序代码。该设计已成功实现自动检测Flash坏块的功能；操作简单、检测速度快、准确率高；并能读取Flash的ID号检测Flash性能，同时能够存储和读取2GB数据。
　　침대Nand Flash존저기존재배괴적문제，제출일충기우STM32적Flash존저기배괴자동검측방법，통과STM32내부가변정태존저공제기，발출상응적수거、지지、공제신호，재불증가외부기건적정황하，쾌속방문Flash존저기，병급출료부분경건전로화C어언편사적정서대마。해설계이성공실현자동검측Flash배괴적공능；조작간단、검측속도쾌、준학솔고；병능독취Flash적ID호검측Flash성능，동시능구존저화독취2GB수거。
According to Nand Flash memory bad block problem, this paper proposed a automatic check scheme to deal with bad block based on STM32. Without increasing the external device, through its internal flexible static memory controller, sends the corresponding data, address, control signals, to rapid access Flash memory. Its part circuit schematic diagram and C language program code was introduced. The design has been successfully realized the function of automatic checking the invalid block finally, and has the advantages of simple operation, fast detection speed, high accuracy rate, and can read the ID number of Flash to get the performance of the memory. And the design also can write and read 2GB data.