电工材料
電工材料
전공재료
ELECTRICAL ENGINEERING MATERIALS
2013年
2期
18-22
,共5页
苗柏和%谢景林%何建平%刘国勋%王文斌%王小军
苗柏和%謝景林%何建平%劉國勛%王文斌%王小軍
묘백화%사경림%하건평%류국훈%왕문빈%왕소군
CuCr触头材料%抗焊接性%焊接结合面%显微组织%断裂特性%X射线光电子能谱
CuCr觸頭材料%抗銲接性%銲接結閤麵%顯微組織%斷裂特性%X射線光電子能譜
CuCr촉두재료%항한접성%한접결합면%현미조직%단렬특성%X사선광전자능보
CuCr contact material%anti-welding property%faying surface%microstructure%fracture characteristics%X-ray photoelectron spectroscopy(XPS)
使用光学显微镜和扫描电镜(SEM)观察熔铸Cu-30CrTe、Cu-30Cr和烧结粉末冶金CuCr25等三种触头材料经真空扩散焊后的室温拉伸断口及焊接结合区纵断面的显微组织。三种触头材料具有不同的断裂特征,熔铸Cu-30CrTe材料焊接结合面的显微组织明显不同于烧结CuCr25;同时参考X射线光电子能谱(XPS)表面分析结果,对添加微量Te改进触头材料抗焊接性的机理和评判原则进行了讨论。
使用光學顯微鏡和掃描電鏡(SEM)觀察鎔鑄Cu-30CrTe、Cu-30Cr和燒結粉末冶金CuCr25等三種觸頭材料經真空擴散銲後的室溫拉伸斷口及銲接結閤區縱斷麵的顯微組織。三種觸頭材料具有不同的斷裂特徵,鎔鑄Cu-30CrTe材料銲接結閤麵的顯微組織明顯不同于燒結CuCr25;同時參攷X射線光電子能譜(XPS)錶麵分析結果,對添加微量Te改進觸頭材料抗銲接性的機理和評判原則進行瞭討論。
사용광학현미경화소묘전경(SEM)관찰용주Cu-30CrTe、Cu-30Cr화소결분말야금CuCr25등삼충촉두재료경진공확산한후적실온랍신단구급한접결합구종단면적현미조직。삼충촉두재료구유불동적단렬특정,용주Cu-30CrTe재료한접결합면적현미조직명현불동우소결CuCr25;동시삼고X사선광전자능보(XPS)표면분석결과,대첨가미량Te개진촉두재료항한접성적궤리화평판원칙진행료토론。
The tensile fracture at room temperature and the faying microstructures of vacuum casting Cu-30CrTe, Cu-30Cr and sintered CuCr25 contact materials after diffusion welding in vacuum were evaluated by optical microscope and SEM. It is found that there are different fracture characteristics in the materials and distinct microstructures formed at the faying surface of the Cu-30CrTe from that of the sintered CuCr25; meanwhile consulting the XPS surface analysis results of elemental content and valence state of trace Te in the Cu-30CrTe contact material, the mechanism and principles of trace Te improving the anti-welding property of the Cu-30CrTe alloy contact material are discussed.