农业环境科学学报
農業環境科學學報
농업배경과학학보
Journal of Agro-Environment Science
2014年
6期
1210-1217
,共8页
蔡长江%卢桂宁%廖长君%陈梅芹%党志
蔡長江%盧桂寧%廖長君%陳梅芹%黨誌
채장강%로계저%료장군%진매근%당지
酸性矿山废水%黄铜矿%钝化剂%氧化
痠性礦山廢水%黃銅礦%鈍化劑%氧化
산성광산폐수%황동광%둔화제%양화
acid mine drainage(AMD)%chalcopyrite%passivation%oxidation
酸性矿山废水(AMD)的形成对环境造成严重危害,而从源头上控制其产生是一项重要的处理措施。本研究利用课题组前期研制的钝化剂三乙烯四胺二硫代氨基甲酸钠(DTC-TETA)对常见硫化矿物黄铜矿进行处理后,通过不同体系的摇瓶实验比较,研究该钝化剂对黄铜矿的化学氧化和生物氧化过程的影响,并利用SEM、XRD和XPS对黄铜矿进行分析,探讨钝化剂的作用机制。结果表明,钝化剂处理过的黄铜矿经过20 d的化学、生物氧化后,产生的铜离子浓度分别是其相应对照的17%和48%,说明钝化剂能有效抑制黄铜矿的氧化速率。SEM结果表明,黄铜矿表面在钝化剂处理后,经过氧化受到的侵蚀明显减少,这是由于钝化剂在黄铜矿表面形成包膜有效隔绝氧化剂和细菌对黄铜矿的接触。样品的XRD和XPS分析结果说明了经钝化剂处理过的黄铜矿在氧化过程中可形成一些产物,但这没有改变黄铜矿的氧化进程。因此,黄铜矿经钝化剂DTC-TETA处理后其氧化速率受到抑制,表明表面钝化法是一项处理硫化物矿物避免产生AMD造成危害的可行技术,这对于从源头上控制AMD具有重要意义。
痠性礦山廢水(AMD)的形成對環境造成嚴重危害,而從源頭上控製其產生是一項重要的處理措施。本研究利用課題組前期研製的鈍化劑三乙烯四胺二硫代氨基甲痠鈉(DTC-TETA)對常見硫化礦物黃銅礦進行處理後,通過不同體繫的搖瓶實驗比較,研究該鈍化劑對黃銅礦的化學氧化和生物氧化過程的影響,併利用SEM、XRD和XPS對黃銅礦進行分析,探討鈍化劑的作用機製。結果錶明,鈍化劑處理過的黃銅礦經過20 d的化學、生物氧化後,產生的銅離子濃度分彆是其相應對照的17%和48%,說明鈍化劑能有效抑製黃銅礦的氧化速率。SEM結果錶明,黃銅礦錶麵在鈍化劑處理後,經過氧化受到的侵蝕明顯減少,這是由于鈍化劑在黃銅礦錶麵形成包膜有效隔絕氧化劑和細菌對黃銅礦的接觸。樣品的XRD和XPS分析結果說明瞭經鈍化劑處理過的黃銅礦在氧化過程中可形成一些產物,但這沒有改變黃銅礦的氧化進程。因此,黃銅礦經鈍化劑DTC-TETA處理後其氧化速率受到抑製,錶明錶麵鈍化法是一項處理硫化物礦物避免產生AMD造成危害的可行技術,這對于從源頭上控製AMD具有重要意義。
산성광산폐수(AMD)적형성대배경조성엄중위해,이종원두상공제기산생시일항중요적처리조시。본연구이용과제조전기연제적둔화제삼을희사알이류대안기갑산납(DTC-TETA)대상견류화광물황동광진행처리후,통과불동체계적요병실험비교,연구해둔화제대황동광적화학양화화생물양화과정적영향,병이용SEM、XRD화XPS대황동광진행분석,탐토둔화제적작용궤제。결과표명,둔화제처리과적황동광경과20 d적화학、생물양화후,산생적동리자농도분별시기상응대조적17%화48%,설명둔화제능유효억제황동광적양화속솔。SEM결과표명,황동광표면재둔화제처리후,경과양화수도적침식명현감소,저시유우둔화제재황동광표면형성포막유효격절양화제화세균대황동광적접촉。양품적XRD화XPS분석결과설명료경둔화제처리과적황동광재양화과정중가형성일사산물,단저몰유개변황동광적양화진정。인차,황동광경둔화제DTC-TETA처리후기양화속솔수도억제,표명표면둔화법시일항처리류화물광물피면산생AMD조성위해적가행기술,저대우종원두상공제AMD구유중요의의。
Acid mine drainage(AMD)has been recognized as one of the most serious long- term environmental problems associated with mining. The oxidation of sulfide-rich tailing is the source of AMD. Therefore source control of AMD is regarded as a most effective way to pre-vent its environmental impact. In this study, a coating agent, sodium triethylenetetramine bisdithiocarbamate(DTC-TETA), was explored to minimize the oxidation of chalcopyrite. Scanning electron microscope(SEM), X-ray diffraction(XRD)and X-ray photoelectron spectroscopy (XPS)were used to examine the mechanisms of chalcopyrite oxidation inhibition by the agent. The coating effectively decreased the oxida-tion rate of chalcopyrite during 20 day of experiment. The concentrations of copper ion in chemical and biological oxidation systems treated with the coating agent were only 17%and 48%of the corresponding controls. Compared to uncoated one, the surface corrosion of the chal-copyrite coated with DTC-TETA was significantly reduced, indicating that the passivation film on chalcopyrite indeed isolated the contact of oxidants and bacteria. In addition, XRD and XPS analyses showed that new secondary minerals formed during the oxidation of the chalcopy-rite, but they did not affect the oxidation process. Our results show that use of coating agent is an effective option to reduce the rates of chal-copyrite oxidation, which is of great significance for controlling AMD from the sources.