CAJ | 학술논문

采用X荧光光谱仪快速分析20款手机表面的Cr、 Cd、 Pb、 Hg以及Br等多种RoHS限制的有害元素含量。该方法对不同大小，形状，品牌的手机可不做任何的预处理，直接无损测定其表面有害元素。测定结果表明，抽查的20款手机，整体表现优秀，合格率达到95％；方法精密度良好。
채용X형광광보의쾌속분석20관수궤표면적Cr、 Cd、 Pb、 Hg이급Br등다충RoHS한제적유해원소함량。해방법대불동대소，형상，품패적수궤가불주임하적예처리，직접무손측정기표면유해원소。측정결과표명，추사적20관수궤，정체표현우수，합격솔체도95％；방법정밀도량호。
Fast analysis of harmful elements in the 20 mobile phone surface , such as Cd, Cr, Pb, Hg and Br, in which RoHS restricted by X -ray fluorescence spectrometry.Without any sample pretreatment , the concentration of harmful elements in samp 1 es with different sizes , shapes and brands can be detected.The determination results showed that spot checks of the 20 mobile phone , qualifiedrate reached 95%, and the precision of the method was good.