红外技术
紅外技術
홍외기술
INFRARED TECHNOLOGY
2014年
6期
443-445
,共3页
姚官生%张向锋%丁嘉欣%吕衍秋
姚官生%張嚮鋒%丁嘉訢%呂衍鞦
요관생%장향봉%정가흔%려연추
Pt/CdS%Schottky%紫外探测器%红外透过率
Pt/CdS%Schottky%紫外探測器%紅外透過率
Pt/CdS%Schottky%자외탐측기%홍외투과솔
Pt/CdS%Schottky%ultraviolet detector%infrared transmittance
制备了Pt/CdS Schottky紫外探测器,对Pt/CdS Schottky紫外芯片对中波红外(3~5μm)的透过率进行了研究,并对器件光电性能进行了测试分析。通过优化 Pt 电极制备条件及对 SiO2增透膜的研究,使Pt/CdS Schottky紫外芯片对中波红外波段的透过率达到85%。室温300 K下,所制备Pt/CdS Schottky紫外探测器在零偏压处的背景光电流为-0.063 nA,在+6 V时的暗电流密度为7.6×10-7 A/cm2,R0A达到7.2×104?·cm2,其50%截止波长为510 nm。
製備瞭Pt/CdS Schottky紫外探測器,對Pt/CdS Schottky紫外芯片對中波紅外(3~5μm)的透過率進行瞭研究,併對器件光電性能進行瞭測試分析。通過優化 Pt 電極製備條件及對 SiO2增透膜的研究,使Pt/CdS Schottky紫外芯片對中波紅外波段的透過率達到85%。室溫300 K下,所製備Pt/CdS Schottky紫外探測器在零偏壓處的揹景光電流為-0.063 nA,在+6 V時的暗電流密度為7.6×10-7 A/cm2,R0A達到7.2×104?·cm2,其50%截止波長為510 nm。
제비료Pt/CdS Schottky자외탐측기,대Pt/CdS Schottky자외심편대중파홍외(3~5μm)적투과솔진행료연구,병대기건광전성능진행료측시분석。통과우화 Pt 전겁제비조건급대 SiO2증투막적연구,사Pt/CdS Schottky자외심편대중파홍외파단적투과솔체도85%。실온300 K하,소제비Pt/CdS Schottky자외탐측기재령편압처적배경광전류위-0.063 nA,재+6 V시적암전류밀도위7.6×10-7 A/cm2,R0A체도7.2×104?·cm2,기50%절지파장위510 nm。
Pt/CdS Schottky UV detector was prepared successfully, the mid-wavelength(3-5 μm) transmits property of Pt/CdS Schottky chip was researched, and the photoelectric characteristics of the detector were studied. The transmittance of the chip was 85%by the grown condition of Pt electrode and the anti-reflection effect of SiO2 deposited layer being optimized. The photo response spectra of the Pt/CdS Schottky diode was tested at room temperature and its zero bias current is -0.063 nA, the dark current density is 7.6×10-7 A/cm2 at a reverse bias of -6 V, and the dynamic impedance value of R0A=7.2×104?·cm2, the 50%cutoff wavelength is 510 nm.