CAJ | 학술논문

电子探针是在电子光学和X射线光谱学原理的基础上发展起来的一种高效率分析仪器。为了使材料研究者更好地了解电子探针的分析功能和利用电子探针进行材料的研究与分析，本文介绍了JXA-8230型电子探针工作原理和主要分析方法，并采用电子探针对AgNi触头材料进行了定性、定量和元素面扫描分析。结果表明，AgNi触头中除了含有Ag和Ni元素外，还含有少量的C和W元素，其中W元素主要分布在Ni相中。
전자탐침시재전자광학화X사선광보학원리적기출상발전기래적일충고효솔분석의기。위료사재료연구자경호지료해전자탐침적분석공능화이용전자탐침진행재료적연구여분석，본문개소료JXA-8230형전자탐침공작원리화주요분석방법，병채용전자탐침대AgNi촉두재료진행료정성、정량화원소면소묘분석。결과표명，AgNi촉두중제료함유Ag화Ni원소외，환함유소량적C화W원소，기중W원소주요분포재Ni상중。
Electron probe micro-analyzer is a kind of high efficient analysis instrument, and it develops based on the principle of electron optical and X-ray spectroscopy. In order to make the material researchers have a better understanding on the analysis function of electron probe micro-analyzer and a better use of electron probe micro-analyzer for analyzing materials, this paper introduces the working principle and main analysis methods of the Japanese electronic JXA-8230 type electron probe micro-analyzer. In addition, quality analysis, quant analysis and mapping analysis of AgNi electrical contact materials are carried on by electrical probe micro-analyzer. Results show that AgNi electrical contact materials contain not only Ag and Ni, but also C and W.