光谱学与光谱分析
光譜學與光譜分析
광보학여광보분석
SPECTROSCOPY AND SPECTRAL ANALYSIS
2014年
9期
2578-2581
,共4页
罗海燕%施海亮%李志伟%李双%熊伟%洪津
囉海燕%施海亮%李誌偉%李雙%熊偉%洪津
라해연%시해량%리지위%리쌍%웅위%홍진
空间外差光谱仪%光谱漂移%仿真分析%热光学试验
空間外差光譜儀%光譜漂移%倣真分析%熱光學試驗
공간외차광보의%광보표이%방진분석%열광학시험
Spatial heterodyne spectroscopy (SHS)%Spectral-line shift%Simulation analysis%Thermal optical experiment
为研究温度对星载空间外差干涉型光谱仪性能的影响,分析了温度变化对光谱仪中准直镜头、成像镜头以及干涉仪组件各光学系统组成部分性能参数的变化关系,建立了温度对光谱仪谱线漂移影响的模型,通过软件仿真和热光学实验对理论模型进行了验证。结果表明,良好的镜头光学设计方案可有效避免星载环境下温度对镜头组件光学性能的影响,干涉仪组件温度变化会使系统基频变化直接导致光谱谱线的漂移,同时温差过大会对光谱仪光谱分辨率产生影响,使光谱谱线发生变形。针对星载空间外差干涉型光谱仪中干涉仪组件的温控条件,应依据基频、结合光谱分辨率和带宽等性能指标提出严格的温控范围。
為研究溫度對星載空間外差榦涉型光譜儀性能的影響,分析瞭溫度變化對光譜儀中準直鏡頭、成像鏡頭以及榦涉儀組件各光學繫統組成部分性能參數的變化關繫,建立瞭溫度對光譜儀譜線漂移影響的模型,通過軟件倣真和熱光學實驗對理論模型進行瞭驗證。結果錶明,良好的鏡頭光學設計方案可有效避免星載環境下溫度對鏡頭組件光學性能的影響,榦涉儀組件溫度變化會使繫統基頻變化直接導緻光譜譜線的漂移,同時溫差過大會對光譜儀光譜分辨率產生影響,使光譜譜線髮生變形。針對星載空間外差榦涉型光譜儀中榦涉儀組件的溫控條件,應依據基頻、結閤光譜分辨率和帶寬等性能指標提齣嚴格的溫控範圍。
위연구온도대성재공간외차간섭형광보의성능적영향,분석료온도변화대광보의중준직경두、성상경두이급간섭의조건각광학계통조성부분성능삼수적변화관계,건립료온도대광보의보선표이영향적모형,통과연건방진화열광학실험대이론모형진행료험증。결과표명,량호적경두광학설계방안가유효피면성재배경하온도대경두조건광학성능적영향,간섭의조건온도변화회사계통기빈변화직접도치광보보선적표이,동시온차과대회대광보의광보분변솔산생영향,사광보보선발생변형。침대성재공간외차간섭형광보의중간섭의조건적온공조건,응의거기빈、결합광보분변솔화대관등성능지표제출엄격적온공범위。
To study the thermal effort on optical properties of spatial heterodyne spectroscopy (SHS) ,the relation between the change in temperature and the degradation of optical properties was analyzed ,including collimator lens ,imaging lens and inter-ferometer unit .The theoretical model was verified and corrected by simulation and thermal-optical test ,which was established to describe the relation between spectral-line shift and groove density change of gratings .The results show that spectrum measure-ments are not affected by small temperature changes in the instrument since the primary effects are a slight defocus of the focal plane array in collimating lens and re-imaging lens under the temperature from 15 to 25 ℃ .Spectral-line shift obtained by the thermal optical analysis is well coincident with the ones calculated by thermal optical experiment because of the temperature chan-ges of interferometer unit .The Littrow wavelength accuracy is better than 2.3 nm unless the temperature change is less than 2.5℃ under the interferometer unit by use of the material BK 7 .