CAJ | 학술논문

由于受制造探测器的半导体质量和工艺过程等因素的影响，红外探测器存在积分时间响应不均匀性。为了提高红外探测器的成像质量，有必要对其存在的非均匀性进行校正。分析了积分时间对探测器单元响应输出的影响，详细阐述了基于积分时间的非均匀性校正算法的原理，并提出了一种盲元补偿方法。将该算法用于国产640×512制冷型探测器的非均匀性校正实验，结果表明该算法对探测器的非均匀性校正具有明显的效果。
유우수제조탐측기적반도체질량화공예과정등인소적영향，홍외탐측기존재적분시간향응불균균성。위료제고홍외탐측기적성상질량，유필요대기존재적비균균성진행교정。분석료적분시간대탐측기단원향응수출적영향，상세천술료기우적분시간적비균균성교정산법적원리，병제출료일충맹원보상방법。장해산법용우국산640×512제랭형탐측기적비균균성교정실험，결과표명해산법대탐측기적비균균성교정구유명현적효과。
Due to the impacts of the quality of semiconductors and the processing to manufacture detectors, there is response nonuniformity in IR detectors with the variation of integration time. In order to improve the imaging quality of IR detectors, it′s necessary to correct the nonuniformity. This paper analyzes the influence integration time has to the response outputs of IR detectors, as well explains the algorithm of nonuniformity correction based on integration time. Besides, this paper also puts forward a method of blind pixels compensation. The result of experiment that applies the algorithm to the nonuniformity correction of domestic-made 640×512 cooled IR detector indicates that such algorithm is effective.