CAJ | 학술논문

为实现SRAM芯片的单粒子翻转故障检测，基于LabVIEW和FPGA设计了一套存储器测试系统：故障监测端基于LabVIEW开发了可视化的测试平台，执行数据的采集、存储及结果分析任务，板卡测试端通过FPGA向参考SRAM和待测SRAM注入基于March C-算法的测试向量，通过NI公司的HSDIO-6548板卡采集2个SRAM的数据，根据其比较结果判定SEU故障是否发生。该系统可以实时监测故障状态及测试进程，并且具有较好的可扩展性。
위실현SRAM심편적단입자번전고장검측，기우LabVIEW화FPGA설계료일투존저기측시계통：고장감측단기우LabVIEW개발료가시화적측시평태，집행수거적채집、존저급결과분석임무，판잡측시단통과FPGA향삼고SRAM화대측SRAM주입기우March C-산법적측시향량，통과NI공사적HSDIO-6548판잡채집2개SRAM적수거，근거기비교결과판정SEU고장시부발생。해계통가이실시감측고장상태급측시진정，병차구유교호적가확전성。
For testing the single event upset fault of SRAM chips,a memory testing system based on LabVIEW and FPGA has been designed. A visual test bench for failure monitoring was developed based on LabVIEW. It could perform the tasks of data acquisition, storage and results analysis. At the testing board, the March C- based test vectors are written to the reference SRAM and the testing SRAM through FPGA. NI HSDIO-6548 boards were used to collect the data of two SRAMs, determined whether SEU failure occurred according to comparison results. The system could accomplish the work of real-time monitoring the fault status and test process with a good extensibility.