CAJ | 학술논문

高被引分析方法经常被运用于竞争对手识别中，但高被引分析方法阈值难以确定。本文尝试通过关键技术路径方法和专利引证地图法识别全息摄影技术领域中的竞争对手及竞争对手格局，从理论分析和实证研究上分析高被引分析方法、关键技术路径方法和专利引证地图法识别竞争对手的不同和各自的局限，并探讨将这三种方法相结合进行竞争对手识别和分析的可行性。
고피인분석방법경상피운용우경쟁대수식별중，단고피인분석방법역치난이학정。본문상시통과관건기술로경방법화전리인증지도법식별전식섭영기술영역중적경쟁대수급경쟁대수격국，종이론분석화실증연구상분석고피인분석방법、관건기술로경방법화전리인증지도법식별경쟁대수적불동화각자적국한，병탐토장저삼충방법상결합진행경쟁대수식별화분석적가행성。
High cited analysis method is usually used in identifying the competitors;however it is hard to determine its threshold. This pa-per attempts to use critical path method and patent citation map to identify competitors and competitive positions in the technology field of holography. The paper attempts to theoretically and empirically analyze the differences and limits of competitors identifying by the three methods of high cited method, CPM and patent citation map. The feasibility of combining these three methods to identify competitors and analyze their competitive positions is also discussed.