电子元件与材料
電子元件與材料
전자원건여재료
ELECTRONIC COMPONENTS & MATERIALS
2014年
11期
86-89
,共4页
耿燕飞%尹立孟%位松%窦鑫%刘华文
耿燕飛%尹立孟%位鬆%竇鑫%劉華文
경연비%윤립맹%위송%두흠%류화문
电子封装%低银钎料%微互连焊点%振动疲劳%断裂模式%尺寸效应
電子封裝%低銀釬料%微互連銲點%振動疲勞%斷裂模式%呎吋效應
전자봉장%저은천료%미호련한점%진동피로%단렬모식%척촌효응
electronic packaging%low silver solder%micro-interconnection solder joint%vibration fatigue%fracture mode%size effect
通过采用一系列与集成电路BGA(球栅阵列)、Flip Chip(倒装焊芯片)真实焊点体积接近的不同尺寸的典型“三明治”结构 Sn0.3Ag0.7Cu 低银无铅微互连焊点,基于动态力学分析的精密振动疲劳试验与微焊点疲劳断口形貌观察相结合的方法,研究了微焊点振动疲劳变形曲线的形成机制、裂纹萌生扩展与断裂机理、温度对振动疲劳行为的影响及微焊点振动疲劳行为的尺寸效应问题。结果表明,保持焊点直径恒定,随着焊点高度的减小,焊点的疲劳寿命增加,而疲劳断裂应变降低,同时焊点的疲劳断裂模式由韧性断裂转变为脆性断裂。
通過採用一繫列與集成電路BGA(毬柵陣列)、Flip Chip(倒裝銲芯片)真實銲點體積接近的不同呎吋的典型“三明治”結構 Sn0.3Ag0.7Cu 低銀無鉛微互連銲點,基于動態力學分析的精密振動疲勞試驗與微銲點疲勞斷口形貌觀察相結閤的方法,研究瞭微銲點振動疲勞變形麯線的形成機製、裂紋萌生擴展與斷裂機理、溫度對振動疲勞行為的影響及微銲點振動疲勞行為的呎吋效應問題。結果錶明,保持銲點直徑恆定,隨著銲點高度的減小,銲點的疲勞壽命增加,而疲勞斷裂應變降低,同時銲點的疲勞斷裂模式由韌性斷裂轉變為脆性斷裂。
통과채용일계렬여집성전로BGA(구책진렬)、Flip Chip(도장한심편)진실한점체적접근적불동척촌적전형“삼명치”결구 Sn0.3Ag0.7Cu 저은무연미호련한점,기우동태역학분석적정밀진동피로시험여미한점피로단구형모관찰상결합적방법,연구료미한점진동피로변형곡선적형성궤제、렬문맹생확전여단렬궤리、온도대진동피로행위적영향급미한점진동피로행위적척촌효응문제。결과표명,보지한점직경항정,수착한점고도적감소,한점적피로수명증가,이피로단렬응변강저,동시한점적피로단렬모식유인성단렬전변위취성단렬。
Series of micro-interconnection Sn0.3Ag0.7Cu low silver sandwich structured solder joints with different sizes were adopted to conduct the vibration fatigue experiments on dynamic mechanical analyzer. The sizes of those solder joints were prepared very close to the real solder joint volume of BGA (ball grid array) and FC (flip chip) in IC (integrated circuit). Experimental results show that the vibration fatigue lives of the solder joints increase with the decreasing of joint height when keep joint diameters constant, but fatigue fracture strains of solder joints show the opposite trends. In addition, the failure modes of solder joints turn from ductile fracture to brittle fracture with the decreasing of joint height.