CAJ | 학술논문

分别在室温（25℃）和高温（300℃）下，通过X射线衍射实验对MgF2和SrF2晶体进行了晶体结构的检测．利用基于Rietveld精修方法的RIETAN－2000程序对所得实验结果进行了解析，精修了MgF2和SrF2晶体在不同温度下的各晶体结构参数，获得了原子各向同性温度因子B．通过Maximum Entropy Meth-od （ MEM）解析得到了MgF2和SrF2晶体的等高电子密度分布图谱，实现了电子密度分布的可视化．
분별재실온（25℃）화고온（300℃）하，통과X사선연사실험대MgF2화SrF2정체진행료정체결구적검측．이용기우Rietveld정수방법적RIETAN－2000정서대소득실험결과진행료해석，정수료MgF2화SrF2정체재불동온도하적각정체결구삼수，획득료원자각향동성온도인자B．통과Maximum Entropy Meth-od （ MEM）해석득도료MgF2화SrF2정체적등고전자밀도분포도보，실현료전자밀도분포적가시화．
In this paper, the crystal structures of MgF2 and SrF2 were tested by X-ray diffraction ( XRD) at room temperature (25℃) and high temperature (300℃), respectively.The crystal structure parameters were refined and the temperature factor B was obtained with Rietvled method which was carried out in the RIETAN-2000 program.In addition, the XRD results were analyzed with Maximum Entropy Method ( MEM) method and the electron density distributions were shown clearly in the form of equal pitch contour, which realized the visual-ization of the distribution of electron density.