功能材料
功能材料
공능재료
JOURNAL OF FUNCTIONAL MATERIALS
2012年
16期
2205-2209
,共5页
韦小凤%王日初%李海普%彭超群
韋小鳳%王日初%李海普%彭超群
위소봉%왕일초%리해보%팽초군
Cu/AuSn20/Ni焊点%界面反应%金属间化合物(IMC)%剪切强度
Cu/AuSn20/Ni銲點%界麵反應%金屬間化閤物(IMC)%剪切彊度
Cu/AuSn20/Ni한점%계면반응%금속간화합물(IMC)%전절강도
Cu/AuSn20/Ni joint%interfacial reaction%intermetallic compound (IMC)%shear strength
采用回流焊技术制备Cu/AuSn20/Ni(质量百分比)焊点,通过扫描电子显微镜及电子万能试验机分析焊点在300℃钎焊后的界面组织及剪切强度。结果表明,Cu/AuSn20/Ni焊点在300℃钎焊较短时间时,AuSn20焊料形成(Au5Sn+AuSn)共晶组织,Cu/AuSn20上界面形成胞状的ζ-(Au,Cu)5Sn层;AuSn20/Ni下界面形成片状(Ni,Au)3Sn2金属间化合物(IMC);随着钎焊时间的延长,基板中Cu、Ni原子不断往焊料扩散,焊料成分发生变化,冷却后焊点的共晶组织消失,上界面形成ζ(Cu)固溶体,下界面的片状(Ni,Au)3Sn2不断长大形成连续IMC层,焊点组织最终由℃(Cu)固溶体和(Ni,Au)3Sn2IMC组成。钎焊接头的剪切强度随钎焊时间延长而增大,但是增大幅度较小。
採用迴流銲技術製備Cu/AuSn20/Ni(質量百分比)銲點,通過掃描電子顯微鏡及電子萬能試驗機分析銲點在300℃釬銲後的界麵組織及剪切彊度。結果錶明,Cu/AuSn20/Ni銲點在300℃釬銲較短時間時,AuSn20銲料形成(Au5Sn+AuSn)共晶組織,Cu/AuSn20上界麵形成胞狀的ζ-(Au,Cu)5Sn層;AuSn20/Ni下界麵形成片狀(Ni,Au)3Sn2金屬間化閤物(IMC);隨著釬銲時間的延長,基闆中Cu、Ni原子不斷往銲料擴散,銲料成分髮生變化,冷卻後銲點的共晶組織消失,上界麵形成ζ(Cu)固溶體,下界麵的片狀(Ni,Au)3Sn2不斷長大形成連續IMC層,銲點組織最終由℃(Cu)固溶體和(Ni,Au)3Sn2IMC組成。釬銲接頭的剪切彊度隨釬銲時間延長而增大,但是增大幅度較小。
채용회류한기술제비Cu/AuSn20/Ni(질량백분비)한점,통과소묘전자현미경급전자만능시험궤분석한점재300℃천한후적계면조직급전절강도。결과표명,Cu/AuSn20/Ni한점재300℃천한교단시간시,AuSn20한료형성(Au5Sn+AuSn)공정조직,Cu/AuSn20상계면형성포상적ζ-(Au,Cu)5Sn층;AuSn20/Ni하계면형성편상(Ni,Au)3Sn2금속간화합물(IMC);수착천한시간적연장,기판중Cu、Ni원자불단왕한료확산,한료성분발생변화,냉각후한점적공정조직소실,상계면형성ζ(Cu)고용체,하계면적편상(Ni,Au)3Sn2불단장대형성련속IMC층,한점조직최종유℃(Cu)고용체화(Ni,Au)3Sn2IMC조성。천한접두적전절강도수천한시간연장이증대,단시증대폭도교소。
The Cu/AuSn20/Ni (mass percent) joint was prepared by the reflow bonding process, and the micro- structure and shear strength of the Cu/AuSn20/Ni joint were investigated. The results showed that, the solder formed a (AusSn+AuSn) eutectic microstructure after reflow at 300℃ for a short time, and the cellular-like (Au,Cu)5 Sn intermetallic compound (IMC) was formed at the upper Cu/AuSn20 interface, while the flake-like (Ni,Au)3Sn2 IMC was formed at the lower AuSn20/Ni interface. Upon increasing the reflow time, more and more Cu(Ni)atoms from the suhtrates diffused into the solder, resulting the shift of chemical composition of the solder. So that the (Au,Cu)sSn phase at the upper Cu/AuSn20 interface transformed into the ζ(Cu) solid solution. The (Ni,Au)3Sn2 phase at the lower AuSn20/Ni interface grew gradually to form a continuous IMC layer. The eutectic microstructure in the solder vanished and the final microstructure of Cu/AuSn20/Ni joint was composed of the ζ(Cu) solid solution and (Ni,Au)3Sn2 IMC layer. The shear strength of the Cu/AuSn20/ Ni joint increased slightly with the increasing of the reflow time.