红外与激光工程
紅外與激光工程
홍외여격광공정
INFRARED AND LASER ENGINEERING
2013年
2期
376-380
,共5页
脱粘缺陷%药柱%包覆层%形变%激光全息干涉
脫粘缺陷%藥柱%包覆層%形變%激光全息榦涉
탈점결함%약주%포복층%형변%격광전식간섭
unbonded defect%grain%coating%deformation%laser holographic interferometry
随着航天火箭技术的迅速发展,如何检测具有较厚(大于4 mm)包覆层药柱的内部小尺寸(小于8 mm)缺陷成为一个需要解决的关键问题.基于光干涉原理,采用激光全息无损检测方法测量了不同包覆层厚度药柱内部小尺寸缺陷的全息图谱,确定了包覆层厚度以及缺陷尺寸对药柱形变的影响.结果发现当包覆层厚度为6 mm时,能够检测的缺陷临界尺寸为2 mm.如果缺陷尺寸小于2 mm,则无法获得清晰的干涉条纹.同时利用获得的全息图谱计算了2~6 mm包覆层药柱缺陷尺寸的实际大小,误差平均值结果小于5%.最终结果表明:用激光全息法检测包覆层厚度大于4 mm、包覆层脱粘缺陷小于8 mm的药柱是一种准确、有效的无损检测手段.
隨著航天火箭技術的迅速髮展,如何檢測具有較厚(大于4 mm)包覆層藥柱的內部小呎吋(小于8 mm)缺陷成為一箇需要解決的關鍵問題.基于光榦涉原理,採用激光全息無損檢測方法測量瞭不同包覆層厚度藥柱內部小呎吋缺陷的全息圖譜,確定瞭包覆層厚度以及缺陷呎吋對藥柱形變的影響.結果髮現噹包覆層厚度為6 mm時,能夠檢測的缺陷臨界呎吋為2 mm.如果缺陷呎吋小于2 mm,則無法穫得清晰的榦涉條紋.同時利用穫得的全息圖譜計算瞭2~6 mm包覆層藥柱缺陷呎吋的實際大小,誤差平均值結果小于5%.最終結果錶明:用激光全息法檢測包覆層厚度大于4 mm、包覆層脫粘缺陷小于8 mm的藥柱是一種準確、有效的無損檢測手段.
수착항천화전기술적신속발전,여하검측구유교후(대우4 mm)포복층약주적내부소척촌(소우8 mm)결함성위일개수요해결적관건문제.기우광간섭원리,채용격광전식무손검측방법측량료불동포복층후도약주내부소척촌결함적전식도보,학정료포복층후도이급결함척촌대약주형변적영향.결과발현당포복층후도위6 mm시,능구검측적결함림계척촌위2 mm.여과결함척촌소우2 mm,칙무법획득청석적간섭조문.동시이용획득적전식도보계산료2~6 mm포복층약주결함척촌적실제대소,오차평균치결과소우5%.최종결과표명:용격광전식법검측포복층후도대우4 mm、포복층탈점결함소우8 mm적약주시일충준학、유효적무손검측수단.
With rapid development of space rocket technology, a key problem needs to be solved. How is small size defect (less than 8 mm) in grain with large coating thickness (greater than 4 mm) detected The holographic maps of solid grains with different thickness were gained by using laser holographic interferometry. The effects of coating thickness and defect size on the deformation of grain were investigated. When coating thickness was fixed at 6 mm, the available detected threshold limit size of defect was about 2 mm. If the sizes of defect were less than 2 mm, distinct interference fringes were not obtained. The actual sizes of defects located between coating with thickness 2-6 mm and grain were calculated by experimental data. Verified by experiment, the average values of the error were less than 5%. Final results indicate that the nondestructive laser holographic interferometry is a kind of valid and accurate method for measuring unbonded defect (less than 8 mm) between coating and grain with coating thickness above 4 mm.