CAJ | 학술논문

原子力显微镜(Atomic Force Microscope,简称AFM)是在扫描隧道显微镜基础上发展起来的一种新型显微镜,利用探针表面原子与样品表面原子之间相互作用力,使用接触和非接触两种模式获得导体、非导体材料以及液体的表面信息.目前AFM在化学领域中已经有了多方面的应用.本文简要介绍了AFM的原理及其在化学中的应用.
원자력현미경(Atomic Force Microscope,간칭AFM)시재소묘수도현미경기출상발전기래적일충신형현미경,이용탐침표면원자여양품표면원자지간상호작용력,사용접촉화비접촉량충모식획득도체、비도체재료이급액체적표면신식.목전AFM재화학영역중이경유료다방면적응용.본문간요개소료AFM적원리급기재화학중적응용.
Atomic force microscope (AFM) is a new type of microscope based on the principles of scanning tunneling microscope. It can be applied for investigating surfaces of conductors, insulators and liquids by measuring forces between the atoms of the tip and the sample through contact or non-contact model. The basic principle of AFM and its application in chemistry are reviewed briefly in this paper.