物理学报
物理學報
물이학보
2013年
7期
262-268
,共7页
吴俊%马志斌?%沈武林%严垒%潘鑫%汪建华
吳俊%馬誌斌?%瀋武林%嚴壘%潘鑫%汪建華
오준%마지빈?%침무림%엄루%반흠%왕건화
掺氮%金刚石膜%刻蚀%非对称磁镜场
摻氮%金剛石膜%刻蝕%非對稱磁鏡場
참담%금강석막%각식%비대칭자경장
nitrogen doping%diamond film%etching%asymmetric magnetic mirror field
采用非对称磁镜场电子回旋共振等离子体分别对沉积过程中掺氮和未掺氮的化学气相沉积金刚石膜进行了刻蚀研究,结果表明:掺氮制备的金刚石膜的刻蚀主要集中在晶棱处,经过4h刻蚀后其表面粗糙度由刻蚀前的4.761μm下降至3.701μm,刻蚀对金刚石膜的表面粗糙度的影响较小;而未掺氮制备的金刚石膜的刻蚀表现为晶面的均匀刻蚀,晶粒坍塌,刻蚀4h后其表面粗糙度由刻蚀前的3.061μm下降至1.083μm.刻蚀导致表面粗糙度显著降低.上述差别的主要原因在于金刚石膜沉积过程中掺氮导致氮缺陷在金刚石晶棱处富集,晶棱处电子发射加强,引导离子向晶棱运动并产生刻蚀,从而加剧晶棱的刻蚀.而未掺氮金刚石膜,其缺陷相对较少且分布较均匀,刻蚀时整体呈现为(111)晶面被均匀刻蚀继而晶粒坍塌的现象.
採用非對稱磁鏡場電子迴鏇共振等離子體分彆對沉積過程中摻氮和未摻氮的化學氣相沉積金剛石膜進行瞭刻蝕研究,結果錶明:摻氮製備的金剛石膜的刻蝕主要集中在晶稜處,經過4h刻蝕後其錶麵粗糙度由刻蝕前的4.761μm下降至3.701μm,刻蝕對金剛石膜的錶麵粗糙度的影響較小;而未摻氮製備的金剛石膜的刻蝕錶現為晶麵的均勻刻蝕,晶粒坍塌,刻蝕4h後其錶麵粗糙度由刻蝕前的3.061μm下降至1.083μm.刻蝕導緻錶麵粗糙度顯著降低.上述差彆的主要原因在于金剛石膜沉積過程中摻氮導緻氮缺陷在金剛石晶稜處富集,晶稜處電子髮射加彊,引導離子嚮晶稜運動併產生刻蝕,從而加劇晶稜的刻蝕.而未摻氮金剛石膜,其缺陷相對較少且分佈較均勻,刻蝕時整體呈現為(111)晶麵被均勻刻蝕繼而晶粒坍塌的現象.
채용비대칭자경장전자회선공진등리자체분별대침적과정중참담화미참담적화학기상침적금강석막진행료각식연구,결과표명:참담제비적금강석막적각식주요집중재정릉처,경과4h각식후기표면조조도유각식전적4.761μm하강지3.701μm,각식대금강석막적표면조조도적영향교소;이미참담제비적금강석막적각식표현위정면적균균각식,정립담탑,각식4h후기표면조조도유각식전적3.061μm하강지1.083μm.각식도치표면조조도현저강저.상술차별적주요원인재우금강석막침적과정중참담도치담결함재금강석정릉처부집,정릉처전자발사가강,인도리자향정릉운동병산생각식,종이가극정릉적각식.이미참담금강석막,기결함상대교소차분포교균균,각식시정체정현위(111)정면피균균각식계이정립담탑적현상.
Nitrogen-doped and undoped diamond films grown by microwave plasma chemical vapor deposition (CVD) were etched by electron cyclotron resonance (ECR) plasma with asymmetric magnetic mirror field. The influences of nitrogen doping on the etching characteristic of CVD diamond films are studied by scanning electron microscope (SEM), X-ray photoelectron spectroscopy(XPS), and surface roughness measuring instrument; and the etching mechanism is explicated in detail by etching models. It is found that the crystal edges are dramatically etched for the nitrogen-doped diamond film, while the (111) facets are etched and crystalline grains collapse for the undoped diamond film. And after etching by ECR plasma for 4 h, the nitrogen-doped diamond film surface roughness decreases from 4.761 μm to 3.701 μm, while the surface roughness of the undoped film decreases from 3.061 μm to 1.083 μm. The results indicate that nitrogen doping has great influence on the etching characteristic of the CVD diamond films. Nitrogen-doping deteriorates the film quality and increases the defect density in the crystallites. And the defects distributed in the crystal edge lead to dramatically etching of the crystal edge. Compared with the nitrogen-doped diamond film, the defect density in undoped diamond film is relatively low and the distribution of defects is comparatively uniform, resulting in the fact that (111) facets would suffer from oxygen cyclotron ion beams bombardment and so grains of the film collapse. The reason why the surface roughness of nitrogen-doped diamond film decreases less than the undoped diamond film is that the movement of ions is affected by the electrons emitting from crystal edge, which weakens the ion bombardment on (111) facets.