基于专用芯片的微波电路模块嵌入式测试设计验证
기우전용심편적미파전로모괴감입식측시설계험증
The embedded design verification test of microwave circuit modules based on specific chips
  • 万方数据
    电子世界 전자세계
    ELECTRONICS WORLD
    2013年 7期 46-48 ,共3页

    刘明军%郭荣斌%赵秀才%夏磊

    류명군%곽영빈%조수재%하뢰

    专用芯片%微波电路模块%嵌入式测试%BIT%故障注入 專用芯片%微波電路模塊%嵌入式測試%BIT%故障註入
    전용심편%미파전로모괴%감입식측시%BIT%고장주입
    Specific Chips%Microwave Circuit Modules%Embedded Test%BTT%Fault Injection
    本文提出一种基于专用芯片的微波电路模块嵌入式测试设计方法,来解决微波电路测试难以接入、故障诊断困难的技术难题,文中阐述了微波电路模块嵌入式测试设计的思路及其硬件设计与软件设计方法,并针对基于专用芯片的微波电路模块嵌入式测试设计进行了验证.
    본문제출일충기우전용심편적미파전로모괴감입식측시설계방법,래해결미파전로측시난이접입、고장진단곤난적기술난제,문중천술료미파전로모괴감입식측시설계적사로급기경건설계여연건설계방법,병침대기우전용심편적미파전로모괴감입식측시설계진행료험증.
    In the Paper,the author introduces an embedded design verification test based on specific chips to solve the technical problems of microwave circuit test and fault diagnosis.The author explains embedded design of microwave circuit modules and approach of hardware design and software design,and final y verifies the embedded design of microwave circuit modules based on specific chips.
    원문보기 원문다운로드 사이트로이동
저자의 최근 논문