CAJ | 학술논문

针对传统数字芯片测试设备检测芯片固定、PC机软件不可扩展、测试电路复杂等问题，设计了一种新型数字芯片测试仪。仪器设计为上位机和下位机两部分，并着重突出了上位机的作用。对组成上位机的编译模块、数据管理模块、SQLite数据库、测试模块和串口设置模块进行了研究，同时对以PL2303芯片为主的串口通信模块和以STC89C52为控制芯片的下位机电路进行了设计。系统能够准确地检测组合逻辑芯片、定位故障点，并能动态生成测试集、扩展可测组合逻辑芯片。
침대전통수자심편측시설비검측심편고정、PC궤연건불가확전、측시전로복잡등문제，설계료일충신형수자심편측시의。의기설계위상위궤화하위궤량부분，병착중돌출료상위궤적작용。대조성상위궤적편역모괴、수거관리모괴、SQLite수거고、측시모괴화천구설치모괴진행료연구，동시대이PL2303심편위주적천구통신모괴화이STC89C52위공제심편적하위궤전로진행료설계。계통능구준학지검측조합라집심편、정위고장점，병능동태생성측시집、확전가측조합라집심편。
Aiming at the problems of traditional digital chip test equipment, such as the tested chips are fixed, PC software cannot be extended, and the testing circuit is complex, etc. , a new digital chip tester has been designed. The design consists of two parts: the host computer, and the lower computer, and the role of the software in host computer is highlighted emphatically. The compositions of host computer, including compilation module, data management module, SQLite database, test module and serial port setup module are researched, in addition, the serial communication module based on PL2303 as the core, and the circuit with STC89C52 as control chip in lower computer are designed. The system can precisely detect combinational logic chip, positioning the fault point, and dynamically create test set, expand measurable combinational logic chip.