核电子学与探测技术
覈電子學與探測技術
핵전자학여탐측기술
NUCLEAR ELECTRONICS & DETECTION TECHNOLOGY
2014年
7期
866-868,873
,共4页
黄明%屈国普%赵越%黄亮
黃明%屈國普%趙越%黃亮
황명%굴국보%조월%황량
涂层测厚%X荧光%反射法%工作曲线
塗層測厚%X熒光%反射法%工作麯線
도층측후%X형광%반사법%공작곡선
coating’ s thickness measurement%X-fluorescence%reflection method%working curve
涂层厚度的控制至关重要,如果涂层厚度没有达到设计标准,对产品性能影响很大。利用实验室仪器搭建起一套涂层测厚试验平台,本试验中以铜、铁作为试验样品,用油漆作为涂层。利用射线穿过物质时的指数衰减规律I=I0 e-μx ,用不同涂层厚度的标准样品进行标定以后,作出工作曲线;测量铜、铁两种基底上的涂层厚度,在涂层厚度介于0.01 g/cm2-0.06 g/cm2的范围内,相关系数分别为0.992和0.995,表明此测厚方法是可行的。
塗層厚度的控製至關重要,如果塗層厚度沒有達到設計標準,對產品性能影響很大。利用實驗室儀器搭建起一套塗層測厚試驗平檯,本試驗中以銅、鐵作為試驗樣品,用油漆作為塗層。利用射線穿過物質時的指數衰減規律I=I0 e-μx ,用不同塗層厚度的標準樣品進行標定以後,作齣工作麯線;測量銅、鐵兩種基底上的塗層厚度,在塗層厚度介于0.01 g/cm2-0.06 g/cm2的範圍內,相關繫數分彆為0.992和0.995,錶明此測厚方法是可行的。
도층후도적공제지관중요,여과도층후도몰유체도설계표준,대산품성능영향흔대。이용실험실의기탑건기일투도층측후시험평태,본시험중이동、철작위시험양품,용유칠작위도층。이용사선천과물질시적지수쇠감규률I=I0 e-μx ,용불동도층후도적표준양품진행표정이후,작출공작곡선;측량동、철량충기저상적도층후도,재도층후도개우0.01 g/cm2-0.06 g/cm2적범위내,상관계수분별위0.992화0.995,표명차측후방법시가행적。
The control of coating’ s thickness is very important.If coating’ s thickness is not up to the standard, it will have a serious effect on the performance of the products.The test platform of coating’ s thickness meas-urement is built in the laboratory, Cu、Fe was used as the test sample, oil paint was used as coating in the ex-periment.The working curves are established after calibration using standard samples,taking advantage of the exponent attenuation law I=I0 e -μx , when ray is traversing matter;measuring coating’ s thickness on the base of Cu and Fe, under a condition that coating’s thickness is from 0.01 g/cm2 to 0.06 g/cm2, the correlation coef-ficient is 0.992 and 0.995 respectively, indicate that the measuring method is feasible.