中国电机工程学报
中國電機工程學報
중국전궤공정학보
ZHONGGUO DIANJI GONGCHENG XUEBAO
2015年
4期
944-952
,共9页
姚修远%金新民%周飞%吴学智%李友敏
姚脩遠%金新民%週飛%吳學智%李友敏
요수원%금신민%주비%오학지%리우민
零电压零电流软开关技术%软开关%二极管反向恢复%损耗模型%开关损耗
零電壓零電流軟開關技術%軟開關%二極管反嚮恢複%損耗模型%開關損耗
령전압령전류연개관기술%연개관%이겁관반향회복%손모모형%개관손모
zero-voltage/zero-current transition (ZVZCT)%soft-switching%reverse recovery%loss model%switching losses
采用谐振极型零电压零电流软开关技术(zero-voltage/ zero-current transition,ZVZCT)旨在消除功率器件的开关损耗,但实际上在软开关谐振换流过程中会引入多次额外的二极管反向恢复过程,产生额外的损耗。由于软开关换流过程中的特殊性,采用一般的方法难以对反向恢复过程中的损耗进行评估和计算,给ZVZCT软开关设计带来了困难。该文在考虑二极管反向恢复过程的基础上,详细介绍了ZVZCT软开关技术的换流过程。通过引入二极管载流子寿命以及电荷控制方程,提出了一种适用于软开关换流条件下的二极管反向恢复损耗模型。最后,通过软开关组件的双脉冲实验验证了该二极管反向恢复损耗模型的正确性。研究表明,采用ZVZCT技术的软开关设备的开关损耗与开关器件的二极管反向恢复特性直接相关。
採用諧振極型零電壓零電流軟開關技術(zero-voltage/ zero-current transition,ZVZCT)旨在消除功率器件的開關損耗,但實際上在軟開關諧振換流過程中會引入多次額外的二極管反嚮恢複過程,產生額外的損耗。由于軟開關換流過程中的特殊性,採用一般的方法難以對反嚮恢複過程中的損耗進行評估和計算,給ZVZCT軟開關設計帶來瞭睏難。該文在攷慮二極管反嚮恢複過程的基礎上,詳細介紹瞭ZVZCT軟開關技術的換流過程。通過引入二極管載流子壽命以及電荷控製方程,提齣瞭一種適用于軟開關換流條件下的二極管反嚮恢複損耗模型。最後,通過軟開關組件的雙脈遲實驗驗證瞭該二極管反嚮恢複損耗模型的正確性。研究錶明,採用ZVZCT技術的軟開關設備的開關損耗與開關器件的二極管反嚮恢複特性直接相關。
채용해진겁형령전압령전류연개관기술(zero-voltage/ zero-current transition,ZVZCT)지재소제공솔기건적개관손모,단실제상재연개관해진환류과정중회인입다차액외적이겁관반향회복과정,산생액외적손모。유우연개관환류과정중적특수성,채용일반적방법난이대반향회복과정중적손모진행평고화계산,급ZVZCT연개관설계대래료곤난。해문재고필이겁관반향회복과정적기출상,상세개소료ZVZCT연개관기술적환류과정。통과인입이겁관재류자수명이급전하공제방정,제출료일충괄용우연개관환류조건하적이겁관반향회복손모모형。최후,통과연개관조건적쌍맥충실험험증료해이겁관반향회복손모모형적정학성。연구표명,채용ZVZCT기술적연개관설비적개관손모여개관기건적이겁관반향회복특성직접상관。
Using the zero-voltage/zero-current transition (ZVZCT) soft-switching technology is to reduce the switching losses of the power devices. But in fact, several extra diode reverse recovery in the commutating process of the soft-switching technology will generate additional losses. Due to the particularity of soft-switching technology, the losses of diode reverse recovery are so hard to evaluate and calculate that make it difficult to design the ZVZCT soft-switching devices. This paper gives thorough analysis on the commutating process of ZVZCT soft-switching technology, with the diode reverse recovery being considered, and the mathematic losses model of the diode reverse recovery is also established by using the diode’s life time and charge equations. Finally, the experimental results are provided to verify the proposed losses model and show that the losses of the diode reverse recovery directly affect the efficiency of the ZVZCT soft-switching devices.