CAJ | 학술논문

电子衍射是晶体结构分析最为常用的实验技术之一，电子衍射花样能直接反映晶体倒易点阵的特征。但利用传统方法对电子衍射花样进行指标化相当耗时、繁杂。为此，本文基于一些常用软件和DM插件对指标化过程中衍射点间距的测量、晶面间距的计算和米勒指数的指认等环节进行实例分析，对指标化过程中的一些常见问题进行可行性讨论，以期实现更为便捷的衍射分析。
전자연사시정체결구분석최위상용적실험기술지일，전자연사화양능직접반영정체도역점진적특정。단이용전통방법대전자연사화양진행지표화상당모시、번잡。위차，본문기우일사상용연건화DM삽건대지표화과정중연사점간거적측량、정면간거적계산화미륵지수적지인등배절진행실례분석，대지표화과정중적일사상견문제진행가행성토론，이기실현경위편첩적연사분석。
Electron diffraction is one of the basic structure analysis techniques, and indexing of the zone axis pattern recorded by films or CCD is a fundamental ability for the electron microscope operators. However, the pattern indexing using the traditional method should be followed by the measuring the distance between diffraction spots and the transmitted spot, calculation the d?spacing of these planes, setting {hkl} indices to them, and calculating the zone axis direction, which is obviously rather tedious and time?consuming. In this paper, we discussed all of the possible methods to improve the indexing procedure by the common used software and DM plugins.