CAJ | 학술논문

文章重点介绍了基于 ATE 设备的 DDS 专用芯片内嵌 DAC 静态参数的一种测试方法。由于 DDS 专用芯片的自身特点，其只能输出一定频率的正弦波，测试开发人员唯一能够控制的只有正弦波输出的频率和幅度。而正弦波电压是非线性的，所以利用线性斜波电压测试 DAC 的传统方法并不能用于 DDS 专用芯片的静态参数测试，只能依靠间接的方式测试其内嵌 DAC 的静态参数。该测试方法通过将正弦波的非线性幅值信息转换为线性的角度信息，实现了 DDS 专用芯片内嵌 DAC 的测试自动化，且测试过程高效可靠。
문장중점개소료기우 ATE 설비적 DDS 전용심편내감 DAC 정태삼수적일충측시방법。유우 DDS 전용심편적자신특점，기지능수출일정빈솔적정현파，측시개발인원유일능구공제적지유정현파수출적빈솔화폭도。이정현파전압시비선성적，소이이용선성사파전압측시 DAC 적전통방법병불능용우 DDS 전용심편적정태삼수측시，지능의고간접적방식측시기내감 DAC 적정태삼수。해측시방법통과장정현파적비선성폭치신식전환위선성적각도신식，실현료 DDS 전용심편내감 DAC 적측시자동화，차측시과정고효가고。
The paper focuses on static parameter testing method of DAC embedded in DDS based on ATE .Due to the inherent characteristics of DDS dedicated silicon ,it can only output a certain frequency sine wave .Testing developers are on‐ly able to control the frequency and amplitude of the sine wave .But the sine‐wave voltage is non‐linear ,so the DAC tradi‐tional testing method using linear ramp voltage can not be used for static parameter testing of DDS dedicated silicon .The em‐bedded DAC static parameters testing can be only relied on indirect ways .In order to achieve the test automation of DAC em‐bedded in DDS chip ,the non‐linear amplitude information of the sine wave is converted to linear angle information in the test method .The experiments demonstrate that this method can achieve efficiently and reliably in actual application .