CAJ | 학술논문

标准样片是实现微电子量值溯源和传递的良好途径，论文着重于通过电路设计实现对数字集成电路参数的模拟，并对标准样片测量不确定度评估展开了相应的研究，用以提升标准样片参数的可编程性和量值的准确性，使之适合用于集成电路测试系统的检定、校准以及比对。最后给出了标准样片的不确定度评定和测量数据。
표준양편시실현미전자량치소원화전체적량호도경，논문착중우통과전로설계실현대수자집성전로삼수적모의，병대표준양편측량불학정도평고전개료상응적연구，용이제승표준양편삼수적가편정성화량치적준학성，사지괄합용우집성전로측시계통적검정、교준이급비대。최후급출료표준양편적불학정도평정화측량수거。
Reference materials are a good way to achieve microelectronic traceability. This paper focuses on the simula‐tion of parameters of digital IC by circuit design, and research on the uncertainty of reference materials, which can improve the programmability and accuracy of reference materials. Therefore, prepared reference materials are suitable for calibration and comparison of ATE. Finally, the paper presents the evaluation of uncertainty and results.