CAJ | 학술논문

论文针对武器装备中电子元器件在实际工作环境中性能参数随温度变化较大的特点，以及一些元器件在筛选过程中必须进行的高低温测试问题。以常见的电容器、电阻器和集成运算放大器为研究对象，通过研究这两类器件在不同温度条件下特性参数的变化规律，并通过实验数据的处理和分析，为提高电子元器件的可靠性水平提供了分析手段，为电子元器件可靠性高低温测试必要性提供佐证。
논문침대무기장비중전자원기건재실제공작배경중성능삼수수온도변화교대적특점，이급일사원기건재사선과정중필수진행적고저온측시문제。이상견적전용기、전조기화집성운산방대기위연구대상，통과연구저량류기건재불동온도조건하특성삼수적변화규률，병통과실험수거적처리화분석，위제고전자원기건적가고성수평제공료분석수단，위전자원기건가고성고저온측시필요성제공좌증。
According to the parameter great changes of electron components in actual working environment ,and high and low temperature test must be carried out on some components in the screening test .Typical capacitor ,resistor and inte‐grated operational amplifier are take as research object ,variation of electron components is realized through the research on these two devices under different temperature conditions ,and through the processing and analysis of experimental data ,the analysis method for improving reliability of electronic components is provided ,the evidence of necessity that high and low temperature test on electronic components is provided .