CAJ | 학술논문

所有的半导体生产系统都存在生产瓶颈，只有提高瓶颈单元的生产能力才能提高整个生产系统的生产能力。由于以往的瓶颈检测方法过于单一，常常难以适用于比较复杂的半导体生产系统，为此通过对前人的工作的努力研究，建立了半导体封装测试制造系统的生产模型，克服了以往单个瓶颈识别指标确定瓶颈的弊端，进而得出生产系统中一种半导体封装测试生产线瓶颈检测的方法。并通过实例证明了该方法的有效性和鲁棒性。
소유적반도체생산계통도존재생산병경，지유제고병경단원적생산능력재능제고정개생산계통적생산능력。유우이왕적병경검측방법과우단일，상상난이괄용우비교복잡적반도체생산계통，위차통과대전인적공작적노력연구，건립료반도체봉장측시제조계통적생산모형，극복료이왕단개병경식별지표학정병경적폐단，진이득출생산계통중일충반도체봉장측시생산선병경검측적방법。병통과실예증명료해방법적유효성화로봉성。
Bottleneck exists in all semiconductor production system. In order to improve the production capacity of the entire production system,we only improve the production capacity of the bottleneck. In the past,the method of bottleneck detection is too single,to apply difficultly to more complex semiconductor production system. The produc-tion model of semiconductor assembly and test production system is set up based on the previous researches. It over-comes the disadvantages of the previous method and comes to a method of bottleneck detection of semiconductor as-sembly and test production line. It demonstrates the effectiveness and robustness of the method by some examples.