CAJ | 학술논문

为对小型数字集成芯片进行测试和诊断，以89C51为微控制器芯片（ MCU），74HC595和74HC165为被测电路的测试引脚扩展芯片，提出了一种数字集成电路测试仪的实现方案。利用 MCU芯片对数字集成电路的测试引脚进行信号采集，通过比对后检测电路是否存在逻辑错误，并将结果发送到液晶显示器上显示。该系统结构简单，可以准确地对组合数字集成电路进行测试。
위대소형수자집성심편진행측시화진단，이89C51위미공제기심편（ MCU），74HC595화74HC165위피측전로적측시인각확전심편，제출료일충수자집성전로측시의적실현방안。이용 MCU심편대수자집성전로적측시인각진행신호채집，통과비대후검측전로시부존재라집착오，병장결과발송도액정현시기상현시。해계통결구간단，가이준학지대조합수자집성전로진행측시。
To test small integrated circuits , the paper proposes an IC testing solution based on the MCU of 89C51 and ICs of 74HC595 and 74HC165.The test vectors are applied to the CUT(circuits under testing) by the MCU,and the test responses are collected by the MCU and compared with the correct responses to check if there are some faults on the MCU ,the LCD is used to display the test results .The testing system has simple structure,and can test digital integrated circuits correctly .