功能材料
功能材料
공능재료
JOURNAL OF FUNCTIONAL MATERIALS
2015年
4期
4153-4158
,共6页
辛雅焜%陈诺夫%吴强%白一鸣%陈吉堃%何海洋%李宁%黄添懋%施辉伟
辛雅焜%陳諾伕%吳彊%白一鳴%陳吉堃%何海洋%李寧%黃添懋%施輝偉
신아혼%진낙부%오강%백일명%진길곤%하해양%리저%황첨무%시휘위
多晶硅薄膜%石墨衬底%籽晶层%氧化锌%择优取向%对流辅助化学气相沉积
多晶硅薄膜%石墨襯底%籽晶層%氧化鋅%擇優取嚮%對流輔助化學氣相沉積
다정규박막%석묵츤저%자정층%양화자%택우취향%대류보조화학기상침적
polycrystalline silicon thin films%graphite substrate%seed layers%ZnO%preferred orientation%con-vection-assisted chemical vapor deposition
在石墨衬底上分别制备了具有(220)和(400)择优取向的多晶硅薄膜.首先利用磁控溅射技术直接在石墨衬底上制备非晶硅薄膜层,以及先制备 ZnO 过渡层,再在 ZnO 过渡层上制备非晶硅薄膜层;然后采用快速退火法对非晶硅薄膜晶化,使其形成多晶硅薄膜籽晶层.XRD 测试表明,未引入 ZnO 过渡层的多晶硅薄膜籽晶层具有高度(220)择优取向,而引入 ZnO 过渡层的多晶硅薄膜籽晶层具有高度(400)择优取向;最后在多晶硅籽晶层上通过对流辅助化学气相沉积(CoCVD)制备多晶硅薄膜.根据 SEM、XRD、拉曼测试表明,多晶硅薄膜的性质延续了多晶硅籽晶层的性质,未引入 ZnO 过渡层的样品,具有高度(220)择优取向.引入 ZnO 过渡层后的样品,具有高度(400)择优取向,(400)择优取向的转变有利于后续多晶硅薄膜太阳电池的制作.同时对 Si(220)和 Si (400)择优取向的形成原因做了初步分析.
在石墨襯底上分彆製備瞭具有(220)和(400)擇優取嚮的多晶硅薄膜.首先利用磁控濺射技術直接在石墨襯底上製備非晶硅薄膜層,以及先製備 ZnO 過渡層,再在 ZnO 過渡層上製備非晶硅薄膜層;然後採用快速退火法對非晶硅薄膜晶化,使其形成多晶硅薄膜籽晶層.XRD 測試錶明,未引入 ZnO 過渡層的多晶硅薄膜籽晶層具有高度(220)擇優取嚮,而引入 ZnO 過渡層的多晶硅薄膜籽晶層具有高度(400)擇優取嚮;最後在多晶硅籽晶層上通過對流輔助化學氣相沉積(CoCVD)製備多晶硅薄膜.根據 SEM、XRD、拉曼測試錶明,多晶硅薄膜的性質延續瞭多晶硅籽晶層的性質,未引入 ZnO 過渡層的樣品,具有高度(220)擇優取嚮.引入 ZnO 過渡層後的樣品,具有高度(400)擇優取嚮,(400)擇優取嚮的轉變有利于後續多晶硅薄膜太暘電池的製作.同時對 Si(220)和 Si (400)擇優取嚮的形成原因做瞭初步分析.
재석묵츤저상분별제비료구유(220)화(400)택우취향적다정규박막.수선이용자공천사기술직접재석묵츤저상제비비정규박막층,이급선제비 ZnO 과도층,재재 ZnO 과도층상제비비정규박막층;연후채용쾌속퇴화법대비정규박막정화,사기형성다정규박막자정층.XRD 측시표명,미인입 ZnO 과도층적다정규박막자정층구유고도(220)택우취향,이인입 ZnO 과도층적다정규박막자정층구유고도(400)택우취향;최후재다정규자정층상통과대류보조화학기상침적(CoCVD)제비다정규박막.근거 SEM、XRD、랍만측시표명,다정규박막적성질연속료다정규자정층적성질,미인입 ZnO 과도층적양품,구유고도(220)택우취향.인입 ZnO 과도층후적양품,구유고도(400)택우취향,(400)택우취향적전변유리우후속다정규박막태양전지적제작.동시대 Si(220)화 Si (400)택우취향적형성원인주료초보분석.
The polycrystalline silicon (poly-Si)thin films with (220)and (400)preferred orientation were pre-pared respectively on graphite substrates.Two kinds of samples were prepared.First,amorphous silicon thin film was prepared directly on graphite substrate by magnetron sputtering technique,and second,the ZnO tran-sition layer was prepared before the deposition of amorphous silicon thin film.Both kinds of samples were an-nealed to prepare the poly-Si thin film seed layers by rapid annealing method.X-ray diffraction (XRD)measure-ments show that the silicon thin film seed layers without ZnO transition layer have highly (220)preferred orien-tation,and the silicon thin film seed layers with ZnO transition layer have highly (400)preferred orientation, after the rapid annealing.Then the poly-Si thin films were prepared by convection-assisted chemical vapor depo-sition (CoCVD)on the poly-Si thin film seed layers.According to the Raman,scanning electron microscope (SEM),and XRD measurements,the structures of the silicon films deposited by CoCVD succeed to the struc-tures of poly-Si seed layers.The samples without ZnO transition layer have highly (220)preferred orientation, and the samples with ZnO transition layer have highly (400)preferred orientation,the transformation of (400) preferred orientation was conducive to the subsequent production of poly-Si thin film solar cells.The mecha-nisms that the Si (220)and Si (400)preferred orientation were analyzed preliminarily.