CAJ | 학술논문

由于工艺的影响，带隙基准电压会有一定的偏差，在ATE测试阶段，需要利用 trim技术对基准电压进行修调．通过一种EEPROM修调电路，在EEPROM 中写入trim code来控制与trim电阻并联的开关，以达到修调基准电压的目的．同时采用了一种新颖的自动修调算法，只需要测试基准电压的初始值，就可以自动找出最佳的trim co de ，对于每个芯片来说既可以节省长达63．3 m s的测试时间，又能够保证测试准确，降低了测试成本．通过对300个芯片的基准电压测试结果的分析，验证了这种算法的准确性．
유우공예적영향，대극기준전압회유일정적편차，재ATE측시계단，수요이용 trim기술대기준전압진행수조．통과일충EEPROM수조전로，재EEPROM 중사입trim code래공제여trim전조병련적개관，이체도수조기준전압적목적．동시채용료일충신영적자동수조산법，지수요측시기준전압적초시치，취가이자동조출최가적trim co de ，대우매개심편래설기가이절성장체63．3 m s적측시시간，우능구보증측시준학，강저료측시성본．통과대300개심편적기준전압측시결과적분석，험증료저충산법적준학성．
Because of process variation ,there will be some voltage deviations in bandgap reference .So we need to trim the bandgap reference in ATE testing phase .An EEPROM circuit can be used to trim the Bandgap voltage . The switches parallel with the resistances can be controlled by writing trim code to EEPROM .A novel algorithm called automatic trimming is also introduced .This algorithm is able to find the best trim code only according to the initial bandgap voltage .Test time is reduced as much as 63 .3 ms and accuracy can also be ensured .The bandgap test results of 300 samples are analyzed to verify the accuracy of the proposed algorithm .