电子器件
電子器件
전자기건
JOURNAL OF ELECTRON DEVICES
2015年
2期
274-277
,共4页
单总线%器件遗漏%电平转化%网络拓扑结构%分布电容%多点测温
單總線%器件遺漏%電平轉化%網絡拓撲結構%分佈電容%多點測溫
단총선%기건유루%전평전화%망락탁복결구%분포전용%다점측온
1-wire bus%sensor miss%electrical level conversion%network topology structure%bus distributed capaci-tance%multipoint temperature detecting
采用C8051F340为核心，实现一个I/O对多个单总线温度器件DS18B20的测温系统时，发现离主机较远的测温点器件信息未能获取，产生器件遗漏的现象。实验分析发现单总线多点温度测量系统中，总线分布电容和电阻引起单总线上信号衰减，导致离主机较远的温度器件收到的主机指令出现错误。经过大量测试实验，提出改变总线拓扑结构和提升总线电平两种可行方案，有效的解决了多点测温系统中温度器件漏读问题，并且增加了系统单总线长度和温度器件接入数量。
採用C8051F340為覈心，實現一箇I/O對多箇單總線溫度器件DS18B20的測溫繫統時，髮現離主機較遠的測溫點器件信息未能穫取，產生器件遺漏的現象。實驗分析髮現單總線多點溫度測量繫統中，總線分佈電容和電阻引起單總線上信號衰減，導緻離主機較遠的溫度器件收到的主機指令齣現錯誤。經過大量測試實驗，提齣改變總線拓撲結構和提升總線電平兩種可行方案，有效的解決瞭多點測溫繫統中溫度器件漏讀問題，併且增加瞭繫統單總線長度和溫度器件接入數量。
채용C8051F340위핵심，실현일개I/O대다개단총선온도기건DS18B20적측온계통시，발현리주궤교원적측온점기건신식미능획취，산생기건유루적현상。실험분석발현단총선다점온도측량계통중，총선분포전용화전조인기단총선상신호쇠감，도치리주궤교원적온도기건수도적주궤지령출현착오。경과대량측시실험，제출개변총선탁복결구화제승총선전평량충가행방안，유효적해결료다점측온계통중온도기건루독문제，병차증가료계통단총선장도화온도기건접입수량。
When we take C8051F340 as the core to realize multipoint temperature detecting by DS18B20 through one I/O port,we found that temperature measuring point sensor information not far away from the host access,generating sensor missing phenomenon. It causes the further temperature sensors do not correctly identify the host command that the bus distributed capacitance and resistance damp the bus signal,through the experimental analysis,which results in the missing of sensor. After a lot of tests,finding that system can improve the voltage increasing the attenuation redun-dancy and change the network topology declining the signal attenuation to solve the problem of omission from sensor. Then increase the 1-wire bus length and the number of the connected temperature sensors.
