化学分析计量
化學分析計量
화학분석계량
CHEMICAL ANALYSIS AND METERAGE
2015年
2期
6-9
,共4页
杨欣欣%张彬%荀其宁%拓锐%胡国星%潘忠泉
楊訢訢%張彬%荀其寧%拓銳%鬍國星%潘忠泉
양흔흔%장빈%순기저%탁예%호국성%반충천
酶标分析仪%波长%标准物质%均匀性%稳定性
酶標分析儀%波長%標準物質%均勻性%穩定性
매표분석의%파장%표준물질%균균성%은정성
ELISA analytical instrument%wavelength%standard reference material%uniformity%stability
以硫化锌为高折射材料和冰晶石为低反射材料,利用真空镀膜技术、光学极值法检测膜厚技术镀制了窄带全介质干涉滤光片,K9玻璃为薄膜保护层,采用切割、粗磨、精磨、抛光、镀膜等光学工艺制得酶标分析仪波长标准物质,经均匀性、稳定性考核合格后,由紫外可见近红外分光光度计标准装置对标准物质定值。研制的酶标分析仪波长标准物质定制结果扩展不确定度为0.7 nm(k=2),使用方便,量值准确、稳定,技术指标满足酶标分析仪波长示值误差及重复性检定/校准工作的需要。
以硫化鋅為高摺射材料和冰晶石為低反射材料,利用真空鍍膜技術、光學極值法檢測膜厚技術鍍製瞭窄帶全介質榦涉濾光片,K9玻璃為薄膜保護層,採用切割、粗磨、精磨、拋光、鍍膜等光學工藝製得酶標分析儀波長標準物質,經均勻性、穩定性攷覈閤格後,由紫外可見近紅外分光光度計標準裝置對標準物質定值。研製的酶標分析儀波長標準物質定製結果擴展不確定度為0.7 nm(k=2),使用方便,量值準確、穩定,技術指標滿足酶標分析儀波長示值誤差及重複性檢定/校準工作的需要。
이류화자위고절사재료화빙정석위저반사재료,이용진공도막기술、광학겁치법검측막후기술도제료착대전개질간섭려광편,K9파리위박막보호층,채용절할、조마、정마、포광、도막등광학공예제득매표분석의파장표준물질,경균균성、은정성고핵합격후,유자외가견근홍외분광광도계표준장치대표준물질정치。연제적매표분석의파장표준물질정제결과확전불학정도위0.7 nm(k=2),사용방편,량치준학、은정,기술지표만족매표분석의파장시치오차급중복성검정/교준공작적수요。
The interference filter reference materials were made by vacuum coating technology and optical film thickness extremum method which plating zinc sulfide as high refraction materials and cryolite as low reflective materials of narrow–band interference filter, and K9 glass was used as film protective layer. After some optical technology such as cutting, coarse grinding,fine grinding,polishing and plating, the uniformity, stability of interference filter reference materials were examinated by the ultraviolet–visible–near infrared spectrophotometer standard device. According to the results, the deterministic uncertainty of the development reference material was 0.7 nm(k=2). Therefore, the developed interference filter reference materials can meet the verification/calibration requirement for wavelength error and repeatability of ELISA analytical instruments with convenience and stable value.