CAJ | 학술논문

根据电化学腐蚀法的基本原理，研究了简单易操作的钨探针的制备方法，并设计了相应的装置。结果表明，在腐蚀溶液NaOH浓度2 mol／L，电压2 V的条件下，得到了尖端曲率半径约40 nm的钨探针，满足扫描隧道显微镜（STM）使用的需求。
근거전화학부식법적기본원리，연구료간단역조작적오탐침적제비방법，병설계료상응적장치。결과표명，재부식용액NaOH농도2 mol／L，전압2 V적조건하，득도료첨단곡솔반경약40 nm적오탐침，만족소묘수도현미경（STM）사용적수구。
Based on the basic principle of electrochemical corrosion , a liquid film preparation method which is simple and easy to be operated was studied to fabricate tungsten probe for STM .Results show that under the conditions that corrosion solution NaOH concentration is 2 mol/L and voltage is 2 V,the tungsten probes ’ tip radiuses of curvature are 40 nm,which meet the requirement of STM .