CAJ | 학술논문

随着SoC电路功能的日益复杂,SoC电路中大量应用了内嵌随机静态存储器,传统的通过MBIST(存储器内建自测试)方式对SoC电路中SRAM的测试,将给SoC电路带来功耗及管芯面积显著增大的问题；同时在传统MBIST方式下,SoC内嵌SRAM的测试严重依赖先进的ATE测试设备,需要付出昂贵的测试成本。文中提出一种软件与MBIST相协同的SRAM测试方法,利用SoC内嵌处理器运行特定算法软件的方式,实现SoC电路中大部分SRAM的测试,同时结合传统MBIT测试方式对其余内嵌处理器难以访问的SRAM进行测试,既实现了复杂SoC中内嵌SRAM测试的完备性,也很好地解决了测试完备性与测试成本的矛盾。
수착SoC전로공능적일익복잡,SoC전로중대량응용료내감수궤정태존저기,전통적통과MBIST(존저기내건자측시)방식대SoC전로중SRAM적측시,장급SoC전로대래공모급관심면적현저증대적문제；동시재전통MBIST방식하,SoC내감SRAM적측시엄중의뢰선진적ATE측시설비,수요부출앙귀적측시성본。문중제출일충연건여MBIST상협동적SRAM측시방법,이용SoC내감처리기운행특정산법연건적방식,실현SoC전로중대부분SRAM적측시,동시결합전통MBIT측시방식대기여내감처리기난이방문적SRAM진행측시,기실현료복잡SoC중내감SRAM측시적완비성,야흔호지해결료측시완비성여측시성본적모순。
With the development of IC, system-on-chip may have many SRAM blocks, the traditional testing method according to MBIST could not only increase the huge numbers of test logic,chip power consumption,but also tie the test to advanced ATE test ma-chine tightly which could also cost much. A kind of new SRAM test method by combining the software achievement and MBIST together is proposed to achieve the testing of SRAM integrated in SoC. The SRAM which could hardly be accessed by any other integrated pro-cessing units would also be tested by combing the traditional MBIT and the methods mentioned in this paper,not only achieving the test completeness of SRAM integrated in SoC,but also handling the conflict between full verification and cost.