光谱学与光谱分析
光譜學與光譜分析
광보학여광보분석
SPECTROSCOPY AND SPECTRAL ANALYSIS
2015年
8期
2324-2328
,共5页
张招红%姜政%薛松%郑丽芳
張招紅%薑政%薛鬆%鄭麗芳
장초홍%강정%설송%정려방
时间分辨谱学%XEOL实验%单光子计数法
時間分辨譜學%XEOL實驗%單光子計數法
시간분변보학%XEOL실험%단광자계수법
Time resolved spectroscopy%TRXEOL%Time-correlated single photon counting method
介绍了上海光源XAFS线站(BL14W1)的时间分辨X射线激发发光光谱(TRXEOL )实验系统。该系统基于时间相关单光子计数法的原理设计,以同步辐射光源的脉冲特性及其良好的时间结构为基础,通过集成定时系统、光谱仪系统和核电子学系统,在国内同步辐射装置上首次实现了 TRXEOL实验方法。定时系统提供同步触发电脉冲,用来标志X射线脉冲打到样品上的时刻,同步精度约6 ps ,延时分辨率5 ps ;光谱仪经光电探测器把样品发光信号转换成电脉冲,核电子学系统对定时电脉冲和发光电脉冲之间的时间差进行统计分析,可得到样品的发光衰减曲线,再结合光谱仪的扫描控制和数据获取系统,可得到样品的TRXEOL光谱。利用该实验系统可以测量发光样品的普通XEOL光谱、发光衰减曲线和TRXEOL光谱。用ZnO纳米线样品,进行了实验验证。实验得到的普通XEOL光谱能够明显区分该样品在390和500 nm处的两个发光中心;得到的发光衰减曲线能够区分小于2 ns的快发光过程和200 ns的慢发光过程;分别在0~1,2~200和0~200 ns时间窗口内测量得到了ZnO纳米线样品的 T RXEOL光谱,在这3个发光时间带内得到了对应的发光信息;ZnO纳米线样品发光衰减曲线快发光峰的半高宽约为0.5 ns ,证明了TRXEOL系统的最小时间分辨率小于1 ns。该系统在国内同步辐射装置上提供了用于研究发光材料的T RXEOL实验方法,该方法与发光模式的XAFS方法相结合,可更深入的研究发光材料的发光行为。整个实验平台操作简便、工作稳定可靠,不仅为发光材料的研究提供了研究手段,还为进一步开展发光模式XAFS和 TRXEOL成像等实验方法提供技术前提。
介紹瞭上海光源XAFS線站(BL14W1)的時間分辨X射線激髮髮光光譜(TRXEOL )實驗繫統。該繫統基于時間相關單光子計數法的原理設計,以同步輻射光源的脈遲特性及其良好的時間結構為基礎,通過集成定時繫統、光譜儀繫統和覈電子學繫統,在國內同步輻射裝置上首次實現瞭 TRXEOL實驗方法。定時繫統提供同步觸髮電脈遲,用來標誌X射線脈遲打到樣品上的時刻,同步精度約6 ps ,延時分辨率5 ps ;光譜儀經光電探測器把樣品髮光信號轉換成電脈遲,覈電子學繫統對定時電脈遲和髮光電脈遲之間的時間差進行統計分析,可得到樣品的髮光衰減麯線,再結閤光譜儀的掃描控製和數據穫取繫統,可得到樣品的TRXEOL光譜。利用該實驗繫統可以測量髮光樣品的普通XEOL光譜、髮光衰減麯線和TRXEOL光譜。用ZnO納米線樣品,進行瞭實驗驗證。實驗得到的普通XEOL光譜能夠明顯區分該樣品在390和500 nm處的兩箇髮光中心;得到的髮光衰減麯線能夠區分小于2 ns的快髮光過程和200 ns的慢髮光過程;分彆在0~1,2~200和0~200 ns時間窗口內測量得到瞭ZnO納米線樣品的 T RXEOL光譜,在這3箇髮光時間帶內得到瞭對應的髮光信息;ZnO納米線樣品髮光衰減麯線快髮光峰的半高寬約為0.5 ns ,證明瞭TRXEOL繫統的最小時間分辨率小于1 ns。該繫統在國內同步輻射裝置上提供瞭用于研究髮光材料的T RXEOL實驗方法,該方法與髮光模式的XAFS方法相結閤,可更深入的研究髮光材料的髮光行為。整箇實驗平檯操作簡便、工作穩定可靠,不僅為髮光材料的研究提供瞭研究手段,還為進一步開展髮光模式XAFS和 TRXEOL成像等實驗方法提供技術前提。
개소료상해광원XAFS선참(BL14W1)적시간분변X사선격발발광광보(TRXEOL )실험계통。해계통기우시간상관단광자계수법적원리설계,이동보복사광원적맥충특성급기량호적시간결구위기출,통과집성정시계통、광보의계통화핵전자학계통,재국내동보복사장치상수차실현료 TRXEOL실험방법。정시계통제공동보촉발전맥충,용래표지X사선맥충타도양품상적시각,동보정도약6 ps ,연시분변솔5 ps ;광보의경광전탐측기파양품발광신호전환성전맥충,핵전자학계통대정시전맥충화발광전맥충지간적시간차진행통계분석,가득도양품적발광쇠감곡선,재결합광보의적소묘공제화수거획취계통,가득도양품적TRXEOL광보。이용해실험계통가이측량발광양품적보통XEOL광보、발광쇠감곡선화TRXEOL광보。용ZnO납미선양품,진행료실험험증。실험득도적보통XEOL광보능구명현구분해양품재390화500 nm처적량개발광중심;득도적발광쇠감곡선능구구분소우2 ns적쾌발광과정화200 ns적만발광과정;분별재0~1,2~200화0~200 ns시간창구내측량득도료ZnO납미선양품적 T RXEOL광보,재저3개발광시간대내득도료대응적발광신식;ZnO납미선양품발광쇠감곡선쾌발광봉적반고관약위0.5 ns ,증명료TRXEOL계통적최소시간분변솔소우1 ns。해계통재국내동보복사장치상제공료용우연구발광재료적T RXEOL실험방법,해방법여발광모식적XAFS방법상결합,가경심입적연구발광재료적발광행위。정개실험평태조작간편、공작은정가고,불부위발광재료적연구제공료연구수단,환위진일보개전발광모식XAFS화 TRXEOL성상등실험방법제공기술전제。
A novel time‐resolved X‐ray excited optical luminescence(TRXEOL) experiment system was developed for X ray ab‐sorption fine structure spectroscopy (XAFS) beamline at Shanghai Synchrotron Radiation Facility (SSRF) .The TRXEOL system is composed of three parts :timing system ,spectrometer system and nuclear instrument module(NIM) system .These three sys‐tems were integrated to measure and record the optical luminescence from the sample excited by the synchrotron X‐ray pulses , according to the time‐correlated single photon counting methodology .It’s the first time in the domestic synchrotron radiation fa‐cilities to achieve TRXEOL experiment using the synchrotron X‐ray pulses and the time structure of the storage ring .In this work ,a SSRF‐self‐developed timing system was used ,which is based on the Field programmable Gate Array and the high‐speed serial communication technology .The timing system can provide trigger pulse synchronized with the X‐ray pulse .The timing jit‐ter is about 6 ps ,and the timing delay resolution is 5 ps .The NIM system is the core of the TRXEOL experiment system ,it has three main modules :the Co nstant Fraction Discriminator(CFD) ,the Time to Amplitude Converter(TAC) and the Multi‐Chan‐nel Analyzer(MCA) .During one excitation circle ,the spectrometer and the Photomultiplier Tube detector tra nslate the induced luminescence of the sample excited by a single X‐ray pulse into electrical pulse .The CFD module eliminates the timing walk lar‐ger than 50 ps induced by the amplitude of the electrical pulse .The TAC module calculates the time interval between the timing trigger pulse and the luminescence electrical pulse ,and converts the interval into proportional amplitude of voltage .After plenty of circles ,the MCA module gets the luminescence decay curve by recording and analyzing the voltage signals .And the data ac‐quisition system gets the TRXEOL spectra by scanning the spectrometer and acquiring the frequency of the voltage pulses from the TAC module .The TRXEOL experiment system hel ps researchers measure optical decay curves and spectra of the sample in different time windows .Many luminescence behaviors would be explained more deeply ,together with the aid of the optical XAFS to get the electron structure of the sample .A sample of ZnO nanowire was studied using the TRXEOL system .The ordi‐nary XEOL spectrum obtained could distinguish the 390 nm wavelength and the 500 nm wavelength luminescence center .The de‐cay curve at 0 nm wavelength could clearly show the fast luminescence process and the slow luminescence process .The full width at half maximum of the fast luminescence decay curve was about 0 .5 ns ,showing that the minimum time resolution of the TRXEOL system is less than 1 ns .The TRXEOL spectra obtained could respectively get the luminescence information within different time windows .It was demo nstrated that the TRXEOL system is not only feasible and reliable ,but also supply XAFS beamline with the technical preparatio ns of time resolved techniques .