光电技术应用
光電技術應用
광전기술응용
ELECTRO-OPTIC WARFARE & RADAR PASSIVE COUNTERMEASURES
2015年
4期
5-7,79
,共4页
大功率半导体激光器%温度应力加速老化%电流步进应力老化%可靠性分析
大功率半導體激光器%溫度應力加速老化%電流步進應力老化%可靠性分析
대공솔반도체격광기%온도응력가속노화%전류보진응력노화%가고성분석
high power semiconductor laser%temperature stress accelerated aging%current step stress aging%reliability analysis
激光器是理想的电光直接转换器件，延长半导体激光器的使用寿命，提高半导体激光器的可靠性，是大功率半导体激光器的研究热点。文中采用温度应力加速和电流步进应力两种老化方法对808 nm的大功率半导体激光器进行老化试验，得到寿命分别为1682 h和1498 h，实验结果基本一致，并在显微镜下观察破坏性老化试验之后的器件，分析得到失效原因主要来自腔面退化、焊料退化和欧姆接触不良。
激光器是理想的電光直接轉換器件，延長半導體激光器的使用壽命，提高半導體激光器的可靠性，是大功率半導體激光器的研究熱點。文中採用溫度應力加速和電流步進應力兩種老化方法對808 nm的大功率半導體激光器進行老化試驗，得到壽命分彆為1682 h和1498 h，實驗結果基本一緻，併在顯微鏡下觀察破壞性老化試驗之後的器件，分析得到失效原因主要來自腔麵退化、銲料退化和歐姆接觸不良。
격광기시이상적전광직접전환기건，연장반도체격광기적사용수명，제고반도체격광기적가고성，시대공솔반도체격광기적연구열점。문중채용온도응력가속화전류보진응력량충노화방법대808 nm적대공솔반도체격광기진행노화시험，득도수명분별위1682 h화1498 h，실험결과기본일치，병재현미경하관찰파배성노화시험지후적기건，분석득도실효원인주요래자강면퇴화、한료퇴화화구모접촉불량。
Laser is the ideal electro-optic direct converter, so prolonging the life of the semiconductor laser and improving the reliability of the laser are always the research focuses of high power semiconductor laser. Two meth?ods such as temperature stress acceleration and current stepping stress are used to perform the aging experiment of 808 nm high power semiconductor laser, and the life of the devices are 1 682 h and 1 498 h respectively, the same experiment result is obtained. Observation of the device after destructive aging tests using a microscope, failure rea?sons are analyzed and obtained, which are due to the surface degradation, solder degradation and bad ohmic con?tact.
