CAJ | 학술논문

单粒子效应是诱发卫星电子设备在轨发生故障的主要原由之一。文章结合实验室开展的空间电子设备单粒子效应敏感性评估试验，介绍了基于脉冲激光单粒子效应试验系统，开展的空间电子设备单粒子效应敏感性评估试验研究，分析总结了空间电子设备单粒子效应敏感性评估试验和加固措施验证的基本过程和试验结果。依据试验过程和结果分析，提出了空间电子设备系统级单粒子效应加固性能实验验证的基本要求和建议。
단입자효응시유발위성전자설비재궤발생고장적주요원유지일。문장결합실험실개전적공간전자설비단입자효응민감성평고시험，개소료기우맥충격광단입자효응시험계통，개전적공간전자설비단입자효응민감성평고시험연구，분석총결료공간전자설비단입자효응민감성평고시험화가고조시험증적기본과정화시험결과。의거시험과정화결과분석，제출료공간전자설비계통급단입자효응가고성능실험험증적기본요구화건의。
The Single Event Effects( SEE) is one of the main factors that inducing the failures in electronic device on satellite. The experimental researches that to identifying the SEE sensitivity of electronic device by using the Pulsed Laser System( PLS) has been introduced,the basis procedures for verifying SEE hardening design based on PLS and some experi-mental results has been summarized. Based on the analysis of experimental results,the main requirements and suggestions for system-level verifying SEE sensitivity hardening design of electronic device have been proposed.