CAJ | 학술논문

提出了一种LED光源黑化失效检测分析流程，分析了LED片式COB光源黑化失效的形成原因。将黑化失效的芯片剥离面用扫描电镜（SEM）等检测仪器对发黑区域进行定位，借助能谱仪（EDS）对发黑区域进行组分分析，确定光源黑化是荧光胶局部碳化所致。有限元模拟分析和验证性实验进一步说明片式COB光源黑化的主要原因是苯基类荧光胶结构中苯环裂解。
제출료일충LED광원흑화실효검측분석류정，분석료LED편식COB광원흑화실효적형성원인。장흑화실효적심편박리면용소묘전경（SEM）등검측의기대발흑구역진행정위，차조능보의（EDS）대발흑구역진행조분분석，학정광원흑화시형광효국부탄화소치。유한원모의분석화험증성실험진일보설명편식COB광원흑화적주요원인시분기류형광효결구중분배렬해。
A process of blackened failure test and analysis of LED lighting source was put forward, and the cause of blackened failure of plate LED COB lighting source was analyzed. Peeling chip and scanning electron microscopy (SEM) and other detecting instrument were used to achieve the position of the black zone, and energy dispersive spectroscopy (EDS ) was used to analyze the component of black area to determine that the blackened failure type was that partial phosphor glue was carbonized. By means of the finite element simulation and verification experiment, the main reason for blackened failure was further proved to be that benzene in phenyl phosphor glue structure was cracked .