电子学报
電子學報
전자학보
Acta Electronica Sinica
2015年
9期
1870-1874
,共5页
白会新%李洪革%谢树果%苏东林
白會新%李洪革%謝樹果%囌東林
백회신%리홍혁%사수과%소동림
CMOS 体驱动%低电压放大器%抗电磁干扰%直流非线性
CMOS 體驅動%低電壓放大器%抗電磁榦擾%直流非線性
CMOS 체구동%저전압방대기%항전자간우%직류비선성
CMOS bulk-driven%low-voltage amplifier%electromagnetic interference (EMI)immunity%direct current (DC) nonlinearity
基于 CMOS 体驱动,提出低电压放大器抗电磁干扰结构.电路采用部分正反馈结构提高体驱动输入级的等效输入跨导,通过输入电压降结构改善体驱动结构的直流非线性,采用双输入级结构保证放大器良好的交流特性,同时,对称拓扑结构保证了电路的高度对称性,实现了对称的转换速率.该设计采用电源电压为1V 的0.35μm 标准CMOS 工艺实现.对该放大器的抗电磁干扰特性进行理论分析与仿真验证,并同传统体驱动放大器相比较.实验结果表明:该结构的电压失调小于50mV,10kHz 频点的输出功率谱密度相比传统结构降低33dBm.
基于 CMOS 體驅動,提齣低電壓放大器抗電磁榦擾結構.電路採用部分正反饋結構提高體驅動輸入級的等效輸入跨導,通過輸入電壓降結構改善體驅動結構的直流非線性,採用雙輸入級結構保證放大器良好的交流特性,同時,對稱拓撲結構保證瞭電路的高度對稱性,實現瞭對稱的轉換速率.該設計採用電源電壓為1V 的0.35μm 標準CMOS 工藝實現.對該放大器的抗電磁榦擾特性進行理論分析與倣真驗證,併同傳統體驅動放大器相比較.實驗結果錶明:該結構的電壓失調小于50mV,10kHz 頻點的輸齣功率譜密度相比傳統結構降低33dBm.
기우 CMOS 체구동,제출저전압방대기항전자간우결구.전로채용부분정반궤결구제고체구동수입급적등효수입과도,통과수입전압강결구개선체구동결구적직류비선성,채용쌍수입급결구보증방대기량호적교류특성,동시,대칭탁복결구보증료전로적고도대칭성,실현료대칭적전환속솔.해설계채용전원전압위1V 적0.35μm 표준CMOS 공예실현.대해방대기적항전자간우특성진행이론분석여방진험증,병동전통체구동방대기상비교.실험결과표명:해결구적전압실조소우50mV,10kHz 빈점적수출공솔보밀도상비전통결구강저33dBm.
Based on CMOS bulk-driven structure,a low-voltage amplifier with high electromagnetic interference (EMI)im-munity is proposed.In the circuit,a partial positive feedback enhances its effective transconductance and an input voltage-drop struc-ture modifies its direct current (DC)nonlinearity.For the overall amplifier,a dual input-stage guarantees its good alternating current (AC)feature,and a symmetrical topology ensures its symmetry and symmetrical slew rate (SR).The amplifier was implemented in a 0.35μm standard CMOS process using 1V power supply.Theoretical analysis and simulation results for EMI robustness are pre-sented and compared with the classical bulk-driven amplifier.The results show that the offset voltage of the proposed amplifier is less than 50mV and the output power spectrum density (PSD)at 10kHz is 33dBm lower than that of the classical structure.