光谱学与光谱分析
光譜學與光譜分析
광보학여광보분석
Spectroscopy and Spectral Analysis
2015年
11期
3082-3086
,共5页
丁亮亮%洪瑞金%陶春先%张大伟
丁亮亮%洪瑞金%陶春先%張大偉
정량량%홍서금%도춘선%장대위
铜薄膜%离子束改性%粗糙度%表面增强拉曼光谱
銅薄膜%離子束改性%粗糙度%錶麵增彊拉曼光譜
동박막%리자속개성%조조도%표면증강랍만광보
Copper film%Ion beam modify%Surface roughness%Surface enhanced Raman spectroscopy
表面增强拉曼光谱(surface‐enhanced Raman spectroscopy ,SERS)技术是一种基于探测吸附于金属基底表面分子振动光谱的快速无损检测方法,目前广泛应用于表面吸附、电化学催化、传感器、生物医学检测和痕量的检测与分析等领域。本实验采用直流磁控溅射技术在BK7玻璃基底上沉积一层厚度为50 nm的金属铜薄膜,在Ar离子轰击作用下获得不同表面粗糙度的金属铜薄膜样品,从而制备具有不同表面增强拉曼光谱活性的金属基底。实验样品分别通过X射线衍射仪(XRD)、原子力显微镜(AFM )、分光光度计、拉曼光谱仪表征其结构、表面形貌及光学性质。测试结果表明铜膜在Ar离子束轰击前后,样品X射线衍射谱的峰值强度没有发生变化,说明其晶相结构未发生改变;随着离子束能量的增加,薄膜表面粗糙度改变,光学散射强度随着表面粗糙度的增加而增强;离子束薄膜表面改性后,以罗丹明B(Rh B)为探针分子,表征薄膜样品表面增强拉曼的活性,通过对比不同样品表面Rh B的拉曼光谱,发现其光谱强度随金属铜薄膜样品表面粗糙度的增加而增强。
錶麵增彊拉曼光譜(surface‐enhanced Raman spectroscopy ,SERS)技術是一種基于探測吸附于金屬基底錶麵分子振動光譜的快速無損檢測方法,目前廣汎應用于錶麵吸附、電化學催化、傳感器、生物醫學檢測和痕量的檢測與分析等領域。本實驗採用直流磁控濺射技術在BK7玻璃基底上沉積一層厚度為50 nm的金屬銅薄膜,在Ar離子轟擊作用下穫得不同錶麵粗糙度的金屬銅薄膜樣品,從而製備具有不同錶麵增彊拉曼光譜活性的金屬基底。實驗樣品分彆通過X射線衍射儀(XRD)、原子力顯微鏡(AFM )、分光光度計、拉曼光譜儀錶徵其結構、錶麵形貌及光學性質。測試結果錶明銅膜在Ar離子束轟擊前後,樣品X射線衍射譜的峰值彊度沒有髮生變化,說明其晶相結構未髮生改變;隨著離子束能量的增加,薄膜錶麵粗糙度改變,光學散射彊度隨著錶麵粗糙度的增加而增彊;離子束薄膜錶麵改性後,以囉丹明B(Rh B)為探針分子,錶徵薄膜樣品錶麵增彊拉曼的活性,通過對比不同樣品錶麵Rh B的拉曼光譜,髮現其光譜彊度隨金屬銅薄膜樣品錶麵粗糙度的增加而增彊。
표면증강랍만광보(surface‐enhanced Raman spectroscopy ,SERS)기술시일충기우탐측흡부우금속기저표면분자진동광보적쾌속무손검측방법,목전엄범응용우표면흡부、전화학최화、전감기、생물의학검측화흔량적검측여분석등영역。본실험채용직류자공천사기술재BK7파리기저상침적일층후도위50 nm적금속동박막,재Ar리자굉격작용하획득불동표면조조도적금속동박막양품,종이제비구유불동표면증강랍만광보활성적금속기저。실험양품분별통과X사선연사의(XRD)、원자력현미경(AFM )、분광광도계、랍만광보의표정기결구、표면형모급광학성질。측시결과표명동막재Ar리자속굉격전후,양품X사선연사보적봉치강도몰유발생변화,설명기정상결구미발생개변;수착리자속능량적증가,박막표면조조도개변,광학산사강도수착표면조조도적증가이증강;리자속박막표면개성후,이라단명B(Rh B)위탐침분자,표정박막양품표면증강랍만적활성,통과대비불동양품표면Rh B적랍만광보,발현기광보강도수금속동박막양품표면조조도적증가이증강。
Surface‐enhanced Raman Spectroscopy (SERS) was a rapid non‐destructive testing .It was based on detecting molecule vibrational spectrum which was adsorbed on the metallic surface .Now it was widely used in surface adsorption ,electrochemical catalysis ,sensors ,bio‐medical testing ,trace amount analysis and other fields .In our experiment ,copper metallic films were de‐posited 50nm on BK7 glass substrates by direct current magnetron sputtering .And then the films were employed for the Ar ion beam etching modification .The structure ,morphology and optical properties was characterized by X‐ray diffraction (XRD) , Atomic Force Microscope (AFM ) ,spectrophotometer and Raman spectroscopy .In the XRD graph ,the peak value of modify copper film were the same with the untreated film .So the structure of copper film was not change .With increasing the power of Ar ion ,the surface roughness was changed ,and scattered spectrum intensity was increased by surface roughness added .With Rhodamine B(Rh B) as a probe molecule ,Raman scattered spectrum was detected on modify copper film .Compared with the dif‐ferent samples ,we can find the Raman signal was enhanced by surface roughness added .It will have some value on study the principles of SERS .