陶瓷学报
陶瓷學報
도자학보
Journal of Ceramics
2015年
5期
464-469
,共6页
曹昉%陈婷%查剑锐%江伟辉%刘健敏%吴倩
曹昉%陳婷%查劍銳%江偉輝%劉健敏%吳倩
조방%진정%사검예%강위휘%류건민%오천
硅酸锆%薄膜%非水解溶胶-凝胶法%致密
硅痠鋯%薄膜%非水解溶膠-凝膠法%緻密
규산고%박막%비수해용효-응효법%치밀
zirconium silicate%film%non-hydrolytic sol-gel process%density
采用非水解溶胶-凝胶法于n型单晶硅基片表面制备出硅酸锆薄膜,并对其相组成及表面形貌进行了研究.运用XRD和FE-SEM研究了热处理温度、前驱体浓度和镀膜次数对硅酸锆合成及薄膜形貌的影响.结果表明:在矿化剂LiF引入的条件下,750 ℃时可以合成硅酸锆粉体,850 ℃时可以制备出致密光滑的硅酸锆薄膜.与粉体的合成相比,薄膜生长属于二维传质,矿化剂作用于薄膜制备时,反应活性效果减弱.在该温度下,前驱体浓度为0.7 mol·L-1时,通过两次镀膜可以获得表面光滑,致密无开裂的硅酸锆薄膜,而继续升高热处理温度则会导致晶粒长大,加剧二次再结晶作用,薄膜的致密性下降.
採用非水解溶膠-凝膠法于n型單晶硅基片錶麵製備齣硅痠鋯薄膜,併對其相組成及錶麵形貌進行瞭研究.運用XRD和FE-SEM研究瞭熱處理溫度、前驅體濃度和鍍膜次數對硅痠鋯閤成及薄膜形貌的影響.結果錶明:在礦化劑LiF引入的條件下,750 ℃時可以閤成硅痠鋯粉體,850 ℃時可以製備齣緻密光滑的硅痠鋯薄膜.與粉體的閤成相比,薄膜生長屬于二維傳質,礦化劑作用于薄膜製備時,反應活性效果減弱.在該溫度下,前驅體濃度為0.7 mol·L-1時,通過兩次鍍膜可以穫得錶麵光滑,緻密無開裂的硅痠鋯薄膜,而繼續升高熱處理溫度則會導緻晶粒長大,加劇二次再結晶作用,薄膜的緻密性下降.
채용비수해용효-응효법우n형단정규기편표면제비출규산고박막,병대기상조성급표면형모진행료연구.운용XRD화FE-SEM연구료열처리온도、전구체농도화도막차수대규산고합성급박막형모적영향.결과표명:재광화제LiF인입적조건하,750 ℃시가이합성규산고분체,850 ℃시가이제비출치밀광활적규산고박막.여분체적합성상비,박막생장속우이유전질,광화제작용우박막제비시,반응활성효과감약.재해온도하,전구체농도위0.7 mol·L-1시,통과량차도막가이획득표면광활,치밀무개렬적규산고박막,이계속승고열처리온도칙회도치정립장대,가극이차재결정작용,박막적치밀성하강.
Zirconium silicate (ZrSiO4) film was prepared on n-type silicon substrate via nonhydrolytic sol-gel method. The phase composition and the microstructure of samples were studied. Meanwhile,the influences of heat treatment temperature,precursor concentration and coating times on the microstructure and the morphology of ZrSiO4film were investigated by means of XRD and FE-SEM. The results indicated that ZrSiO4 powder was synthesized at 750℃ by introducing mineralizer LiF. However,the dense and smooth ZrSiO4 film was fabricated at 850℃because the ionic migration of the two-dimensional film was more difficult than that of powder,which weakened the synthesis effect of zirconium silicate films correspondingly. At this temperature,the dense and smooth ZrSiO4 film was obtained with the precursor concentration of 0.7 mol·L-1 after coating twice. Increasing the heat treatment temperature,the ZrSiO4 grain grew and recrystallized,which caused the decrease of film density.