中国有色金属学报(英文版)
中國有色金屬學報(英文版)
중국유색금속학보(영문판)
Transactions of Nonferrous Metals Society of China
2015年
11期
3678-3684
,共7页
罗广圣%周卫平%李建德%姜贵文%唐少龙%都有为
囉廣聖%週衛平%李建德%薑貴文%唐少龍%都有為
라엄골%주위평%리건덕%강귀문%당소룡%도유위
铁氧体%铜离子掺杂%介电常数%介电色散%介电损耗%电阻率
鐵氧體%銅離子摻雜%介電常數%介電色散%介電損耗%電阻率
철양체%동리자참잡%개전상수%개전색산%개전손모%전조솔
ferrite%Cu ion substitution%dielectric constant%dielectric dispersion%dielectric loss%resistivity
通过传统的陶瓷制备工艺制备了一系列Cu掺杂的Ni0.5?xCuxZn0.5Fe2O4(x=0.12,0.16,0.20,0.24,0.28)尖晶石铁氧体,研究Cu离子掺杂对其结构和介电性质的影响。XRD结果表明所有样品均生成了单一的立方尖晶石结构,并且晶格常数随着Cu掺入量的增加而增加。通过扫描电镜观察到位于晶界处的白色颗粒为富Cu相。介电常数随频率变化曲线显示出尖晶石铁氧体典型的介电行为。但介电损耗随频率变化曲线则表现异常,所有的 Cu掺杂Ni?Zn铁氧体样品在某一频率下都表现出损耗峰。由于单位体积内Fe2+/Fe3+之间跃迁的电子数目减少,x=0.2的样品电阻率最大,而介电常数和介电损耗则最小。
通過傳統的陶瓷製備工藝製備瞭一繫列Cu摻雜的Ni0.5?xCuxZn0.5Fe2O4(x=0.12,0.16,0.20,0.24,0.28)尖晶石鐵氧體,研究Cu離子摻雜對其結構和介電性質的影響。XRD結果錶明所有樣品均生成瞭單一的立方尖晶石結構,併且晶格常數隨著Cu摻入量的增加而增加。通過掃描電鏡觀察到位于晶界處的白色顆粒為富Cu相。介電常數隨頻率變化麯線顯示齣尖晶石鐵氧體典型的介電行為。但介電損耗隨頻率變化麯線則錶現異常,所有的 Cu摻雜Ni?Zn鐵氧體樣品在某一頻率下都錶現齣損耗峰。由于單位體積內Fe2+/Fe3+之間躍遷的電子數目減少,x=0.2的樣品電阻率最大,而介電常數和介電損耗則最小。
통과전통적도자제비공예제비료일계렬Cu참잡적Ni0.5?xCuxZn0.5Fe2O4(x=0.12,0.16,0.20,0.24,0.28)첨정석철양체,연구Cu리자참잡대기결구화개전성질적영향。XRD결과표명소유양품균생성료단일적립방첨정석결구,병차정격상수수착Cu참입량적증가이증가。통과소묘전경관찰도위우정계처적백색과립위부Cu상。개전상수수빈솔변화곡선현시출첨정석철양체전형적개전행위。단개전손모수빈솔변화곡선칙표현이상,소유적 Cu참잡Ni?Zn철양체양품재모일빈솔하도표현출손모봉。유우단위체적내Fe2+/Fe3+지간약천적전자수목감소,x=0.2적양품전조솔최대,이개전상수화개전손모칙최소。
A series of Cu-substituted Ni0.5?xCuxZn0.5Fe2O4 (x=0.12, 0.16, 0.20, 0.24 and 0.28) spinel ferrites were prepared by conventional ceramic method to investigate the effects of Cu compositional variation on the structure and dielectric properties. XRD patterns demonstrate that all the samples are crystallized in single-phase cubic spinel structure and the lattice constant increases with increasing Cu content. White grains observed by SEM are Cu-rich phase. The dielectric constant versus frequency curve displays a normal dielectric behavior of spinel ferrites. While the frequency dependence of dielectric loss tangent is found to be abnormal, exhibiting a peak at certain frequency for all Cu-substituted Ni?Zn ferrites. A maximum of the resistivity is observed atx=0.2 due to the decrease of hopping electrons between Fe2+ and Fe3+ in per unit volume, which is in contrast with the Cu content dependence of dielectric constant and dielectric loss.