计算机工程与应用
計算機工程與應用
계산궤공정여응용
COMPUTER ENGINEERING AND APPLICATIONS
2014年
8期
122-126,142
,共6页
罗李焱%徐德%张正涛%张娟
囉李焱%徐德%張正濤%張娟
라리염%서덕%장정도%장연
聚焦区域选择%聚焦搜索算法%自动聚焦%柱状零件%显微视觉%微装配
聚焦區域選擇%聚焦搜索算法%自動聚焦%柱狀零件%顯微視覺%微裝配
취초구역선택%취초수색산법%자동취초%주상령건%현미시각%미장배
focus area selecting%focus searching algorithm%autofocus%columnar parts%micro-vision%micro-assembly
针对显微视觉中的柱状物体图像的清晰度问题,提出了一种实时检测图像特征并跟踪特征区域进行自动聚焦的方法。该聚焦算法包括聚焦评价函数、聚焦搜索算法和聚焦区域选择。该聚焦搜索算法实现了显微视觉系统下快速准确的聚焦,克服了爬山搜索算法的缺点,有效避免搜索结果陷入局部极大值。显微视觉中对聚焦区域的选择尤为重要,以图像特征区域作为聚焦区域,实时检测该特征区域进行聚焦,实现了在景深小于柱状物体半径的情形下对柱状物体边缘的精确聚焦。粗聚焦后电机位置的标准差为205μm,精聚焦后电机位置的标准差为37μm。实验结果表明,该自动聚焦方法能够满足微装配系统对显微视觉的聚焦需求。
針對顯微視覺中的柱狀物體圖像的清晰度問題,提齣瞭一種實時檢測圖像特徵併跟蹤特徵區域進行自動聚焦的方法。該聚焦算法包括聚焦評價函數、聚焦搜索算法和聚焦區域選擇。該聚焦搜索算法實現瞭顯微視覺繫統下快速準確的聚焦,剋服瞭爬山搜索算法的缺點,有效避免搜索結果陷入跼部極大值。顯微視覺中對聚焦區域的選擇尤為重要,以圖像特徵區域作為聚焦區域,實時檢測該特徵區域進行聚焦,實現瞭在景深小于柱狀物體半徑的情形下對柱狀物體邊緣的精確聚焦。粗聚焦後電機位置的標準差為205μm,精聚焦後電機位置的標準差為37μm。實驗結果錶明,該自動聚焦方法能夠滿足微裝配繫統對顯微視覺的聚焦需求。
침대현미시각중적주상물체도상적청석도문제,제출료일충실시검측도상특정병근종특정구역진행자동취초적방법。해취초산법포괄취초평개함수、취초수색산법화취초구역선택。해취초수색산법실현료현미시각계통하쾌속준학적취초,극복료파산수색산법적결점,유효피면수색결과함입국부겁대치。현미시각중대취초구역적선택우위중요,이도상특정구역작위취초구역,실시검측해특정구역진행취초,실현료재경심소우주상물체반경적정형하대주상물체변연적정학취초。조취초후전궤위치적표준차위205μm,정취초후전궤위치적표준차위37μm。실험결과표명,해자동취초방법능구만족미장배계통대현미시각적취초수구。
On account of columnar parts in microscope vision system, an autofocus method of the real-time image charac-teristics detecting and feature area tracking is presented. Focus evaluation function, focus searching algorithm and focus area selecting is included in the proposed focusing algorithm. The system can achieve autofocus quickly and accurately, and the shortcomings of hill-climbing searching algorithm and local maximum of the searching result can be overcome. Meanwhile, it is important to select an appropriate focus area. The image feature area is used as focus area in the paper. The microscope vision system focuses after detecting the image feature. It can focus accurately at the columnar parts’ edge in the situations of the radius of the columnar parts is shorter than the depth of scope. The standard variance error is 205μm for coarse focus, and 37μm for fine focus. Experimental results prove the autofocus method can satisfy the request of the micro-assembly system for focus.